First Data from a Commercial Local Electrode Atom Probe (LEAP)

Kelly, Tom; Gribb, Tye T.; Olson, Justin; Martens, R. L.; Shepard, Jeffrey D.; Wiener, Scott A.; Kunicki, T.; Ulfig, Robert M.; Lenz, Daniel; Strennen, Eric M.; Oltman, E.; Bunton, Joseph H.; Strait, David R.

doi:10.1017/s1431927604040565

Cited by 187 publications

(92 citation statements)

References 25 publications

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“…Compared with conventional atom probes, the use of a local electrode has been shown to increase the sustainable evaporation rate and field of view [2]. The localized electric field produced by the local electrode enables arrays of specimens to be analyzed, as opposed to a single, electropolished wire needle.…”

Section: Introductionmentioning

confidence: 99%

“…In order to have an accurate 3-D reconstruction of the original, the field required for atomic evaporation must be known a-priori. For many metallic materials, this evaporation field is well characterized, and 3-D reconstructions can be achieved with reasonable accuracy.Compared with conventional atom probes, the use of a local electrode has been shown to increase the sustainable evaporation rate and field of view [2]. The localized electric field produced by the local electrode enables arrays of specimens to be analyzed, as opposed to a single, electropolished wire needle.…”

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confidence: 99%

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Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis

et al. 2008

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IntroductionAtom probe tomography has primarily been used for atomic scale characterization of high electrical conductivity materials [1]. A high electrical field applied to needle-shaped specimens evaporates surface atoms, and a time of flight measurement determines each atom's identity. A 2-dimensional detector determines each atom's original position on the specimen. When repeated successively over many surface monolayers, the original specimen can be reconstructed into a 3-dimensional representation. In order to have an accurate 3-D reconstruction of the original, the field required for atomic evaporation must be known a-priori. For many metallic materials, this evaporation field is well characterized, and 3-D reconstructions can be achieved with reasonable accuracy.Compared with conventional atom probes, the use of a local electrode has been shown to increase the sustainable evaporation rate and field of view [2]. The localized electric field produced by the local electrode enables arrays of specimens to be analyzed, as opposed to a single, electropolished wire needle. Specimen arrays increase throughput by minimizing exchange to UHV and cryogenic temperatures, as well as increasing material statistics through analysis of many specimens. In order to take advantage of these specimen arrays, preparation techniques utilizing in-situ FIB liftout techniques were developed [3]. These techniques allow routine preparation of nominally 100nm diameter specimens. The FIB also enables much improved control of the specimen diameter so the atom probe experiments can be tuned accordingly.The maturation of local electrode and laser pulsed atom probe hardware, as well as FIB specimen preparation techniques, have enabled atom probe analysis of non-traditional materials such as semiconductors, ceramics, and some organic materials to become more commonplace [4]. For most of these materials, the evaporation field is not well characterized. For example, oxides and III-V materials tend to evaporate in clusters of atoms, rather than individual atoms [5]. The physics of cluster evaporation in atom probe experiments are not well understood, and the evaporation field required is also not well characterized. In order to increase the accuracy of the 3-D reconstructions in non-traditional materials, the evaporation field and its progression during an atom probe experiment should be calculated using the specimen geometric features, such as tip radius and shank angle.While a combination FIB and SEM can give some information about atom probe specimen structure, higher resolution characterization of specimens using TEM and STEM can further increase reconstruction accuracy. TEM can image not only the specimen radius and shank angle with higher precision, but also can give the internal structure of interfaces and precipitates. Diffraction and high resolution imaging can give information about the orientation of crystallographic axes with respect to the specimen, and thus allow accurate scaling of the reconstruction in the z-direction. Analyti...

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Section: Introductionmentioning

confidence: 99%

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confidence: 99%

Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis

et al. 2008

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“…The time of flight of ions, i.e., the duration of the flight of ions between the pulse start time and the impact stop time is used to establish time-of-flight mass spectrometry. More details on the overall functioning and especially all physical aspects about the atom probe microscopy technique can be found in the literature [13,14]. Different applications were developed more recently notably for the microscopic material characterization [15] and for investigating atomic force microscope tips and interfacial phenomena [16].…”

Section: Atom Probe Tomography Descriptionmentioning

confidence: 99%

Analysis of Excitation Pulsed Signal Propagation for Atom Probe Tomography System

Ravelo¹,

Vurpillot²

2014

PIER Letters

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Abstract-The purpose of this paper is on the behavioral modelling of surge voltage pulses used in Atom Probe Tomography. After brief description of the atom probe functioning principle, we examine the excitation electrical pulse signal integrity along the electric pulser (E-pulser) feeding line modelling with respect to the IEC1733/04 standard. This feeding electric line is ended by cylindrical via ground to control the ion emission. By using the transmission line (TL) ultra-broadband RLCG model, the propagating pulsed signals degradation is predicted. The signal propagation was analysed in both frequency and time domains by taking into account the substrate dispersion. The wideband frequency behaviours of the surge signal along the feeding line were examined from DC-to-2 GHz. In addition, by considering pulse surge signals with pulse-width and rise-/fall-time parameters (T 1 = 9 ns, t r1 = t f 1 = 1.6 ns) and (T 2 = 30 ns, t r2 = 4 ns/t f 2 = 18 ns), the transient responses from 5 cm-to-20 cm length TL are characterized. It was shown that the excitation pulse was significantly distorted. It was emphasized that the operated signal delay varies from 0.3 ns-to-1.5 ns in function of the via capacitor value. The time-dependent radiated E-field on the performance of the atom probe system which enables to characterize the nature of tested materials (ions or atoms) is discussed. The presented analysis approach is particularly useful for E-pulser integrated in measurement scientific instruments as Atom Probe Tomography time of flight optimisation, a nano-analysing technique that uses ultra-sharp high vacuum pulse to induce controlled erosion of samples. In this application, the excitation voltage pulse integrity during the propagation is required in order to improve the measurement instrument performances.

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“…Three-dimensional atom probe (3DAP) analyses were performed using a local electrode atom probe with a reflectron (CAMECA LEAP 3000X HR R ) facility [14]. The atom probe specimens were electrically pulsed with a pulse fraction of 15% and a pulse repetition rate of 200 kHz.…”

Section: Microstructural Characterizationmentioning

confidence: 99%

Influence of thermal aging on cast stainless steels used in JAEA's nuclear reactor Fugen

Nogiwa

Onitsuka

Abe

et al. 2013

Journal of Nuclear Science and Technology

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The influence of thermal aging on cast stainless steels used in JAEA's advanced thermal prototype reactor "Fugen" that were exposed to 275• C for about 15 years was investigated. The degree and mechanism of thermal embrittlement were evaluated on the basis of Charpy impact test results and the three-dimensional atom probe (3DAP) analysis of the microstructural changes in the spinodal decomposition using materials obtained from Fugen. The results revealed early signs of a thermal aging effect over a long period at the low temperature.

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First Data from a Commercial Local Electrode Atom Probe (LEAP)

Cited by 187 publications

References 25 publications

Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis

Hardware and Techniques for Cross- Correlative TEM and Atom Probe Analysis

Analysis of Excitation Pulsed Signal Propagation for Atom Probe Tomography System

Influence of thermal aging on cast stainless steels used in JAEA's nuclear reactor Fugen

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