2023
DOI: 10.1002/solr.202300610
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First Experimental Evidence of Amorphous Tin Oxide Formation in Lead‐Free Perovskites by Spectroscopic Ellipsometry

Giovanni Mannino,
Jesús Sanchez-Diaz,
Emanuele Smecca
et al.

Abstract: The most promising lead‐free options for producing perovskite solar cells are tin halide perovskite (Sn‐HP) materials. Here, while in situ monitoring the optical evolution of the material in humid air, we used spectroscopic ellipsometry to investigate the dielectric function of FASnI3 layers (with and without additives) within the range of 1–5eV. According to calculations based on the density functional theory that showed oxygen diffusion on FASnI3 surfaces, the steady decrease in absorption coefficient in the… Show more

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Cited by 2 publications
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“…The combination of NaBH 4 and DipI additives produced a synergistic effect in FASnI 3 films increasing their stability, where the former was a reducing agent avoiding Sn +2 oxidation while the latter acted as a passivating agent, resulting in an enhancement of their optoelectronic properties under N 2 and ambient conditions, as discussed in previous works. 23,26 The commercial DBR mirrors (central wavelength 890 nm, supplied by Edmund Optics, Ref. 63 154, and Eksma Optics, Ref.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The combination of NaBH 4 and DipI additives produced a synergistic effect in FASnI 3 films increasing their stability, where the former was a reducing agent avoiding Sn +2 oxidation while the latter acted as a passivating agent, resulting in an enhancement of their optoelectronic properties under N 2 and ambient conditions, as discussed in previous works. 23,26 The commercial DBR mirrors (central wavelength 890 nm, supplied by Edmund Optics, Ref. 63 154, and Eksma Optics, Ref.…”
Section: Methodsmentioning
confidence: 99%
“…[24] The spectral position of the relatively narrow, 10 meV, ASE line is located at 1.37-1.39 eV, as observed in Figure 1b, which is redshifted by 10-30 meV with respect to the PL peak energy at ≈1.395 eV (888 nm), and 60-90 meV below the energy band gap at 1.46 +/-0.03 eV, as recently measured for these films by ellipsometry. [26] The multilayer structure of the microcavity was designed to tune M0 within the PL energies. In particular, the bandpass of the DBRs was chosen to be centered at 880 nm with a full width at half maximum (FWHM) >80 nm, see Figure S1 (Supporting Information), the thicknesses of FASnI 3 (d 1 ) and Au (d 3 ) were fixed to d 1 = 200 nm and d 3 = 30 nm, respectively, while d 2 , the PMMA thickness, was used as the tuning parameter for M0.…”
Section: Design and Simulationsmentioning
confidence: 99%