2013
DOI: 10.1103/physrevb.87.245117
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First-principles study of compensation mechanisms in negatively charged LaGaO3/MgAl2O4interfaces

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Cited by 15 publications
(12 citation statements)
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“…The lattice parameters of the optimized structure with the 5/3 unit cell are shown in Table I. The results are essentially the same as those obtained by Rébola et al 17 and agree well with experimental data. or Ca atoms.…”
Section: B Computational Methodssupporting
confidence: 86%
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“…The lattice parameters of the optimized structure with the 5/3 unit cell are shown in Table I. The results are essentially the same as those obtained by Rébola et al 17 and agree well with experimental data. or Ca atoms.…”
Section: B Computational Methodssupporting
confidence: 86%
“…2. After structural relaxation, we find a clustering with three units of Ca 2 CoO 3 (denoted by X 3 ) along the b axis of the RS subsystem, which is a feature also observed by Rébola et al 17 . Due to this clustering, the CoO 6 octahedra on the either side of X 3 are significantly distorted.…”
Section: B Computational Methodssupporting
confidence: 82%
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“…where spinel demonstrates remarkable resistance to formation of structural damages caused by neutrons and light ions, e.g., amorphous microareas inside MgAl2O4 lattice, which essentially weaken further penetration of irradiation; (ii) defective spinel crystals, colored or colorless, in dependence on what kind of point defects is prevailing in them (neutral or charged vacancies, native interstitials and anti-sites, impurity substitutes, pair-wise defects, etc. ), used in different electronic and optical devices [9][10][11] (as to irradiation in the range of visible spectrum, just presence of F centers is mainly responsible for it); (iii) supporting material for catalytic reactions possessing long-term durability [12,13] (it was found that oxygen vacancies at its surface layers of support play prominent role in dispersion of catalytic metal nanoclusters, their migration and stabilization); (iv) thin films of Mg-spinel used in humidity-measured devices [14].…”
Section: Introductionmentioning
confidence: 99%