2020
DOI: 10.3390/app10207210
|View full text |Cite
|
Sign up to set email alerts
|

Flat Field Soft X-ray Spectrometry with Reflection Zone Plates on a Curved Substrate

Abstract: We report on the first experimental results obtained with a newly designed instrument for high-resolution soft X-ray spectroscopy, using reflection zone plates (RZPs) on a spherical substrate. The spectrometer was tested with a fluorescence source. High-resolution flat field spectra within ±50% around the design energies were measured at an interval of 150–750 eV, using only two RZPs: the first RZP, with its design energy of 277 eV, covered the band of 150–370 eV, and the second RZP, with a design energy of 45… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
13
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
5
3

Relationship

3
5

Authors

Journals

citations
Cited by 11 publications
(13 citation statements)
references
References 7 publications
0
13
0
Order By: Relevance
“…With its diameter of (13.0 − 15.5) mm and a length of 100 mm, this Au-coated optic provides an acceptance solid angle of 2.2 msr and a reflectivity of ≈ 74 % (CXRO), assuming a surface roughness of ±1 nm (rms). Using an RZP on a plane substrate to disperse the convergent beam in its (+1) st diffraction order on the detector, the Hettrick-Underwood 6 principle is implemented to yield a 46-fold enhanced photon flux, compared to our initial, [3][4][5] "grating-only" design. The overall layout, as sketched in Fig.…”
Section: Optical Design and Wavefront Correctionmentioning
confidence: 99%
See 1 more Smart Citation
“…With its diameter of (13.0 − 15.5) mm and a length of 100 mm, this Au-coated optic provides an acceptance solid angle of 2.2 msr and a reflectivity of ≈ 74 % (CXRO), assuming a surface roughness of ±1 nm (rms). Using an RZP on a plane substrate to disperse the convergent beam in its (+1) st diffraction order on the detector, the Hettrick-Underwood 6 principle is implemented to yield a 46-fold enhanced photon flux, compared to our initial, [3][4][5] "grating-only" design. The overall layout, as sketched in Fig.…”
Section: Optical Design and Wavefront Correctionmentioning
confidence: 99%
“…2 Recently, we demonstrated high-resolution soft X-ray spectroscopy on TiO 2 over a wide energy range in our lab. [3][4][5] However, the most of the low photon flux from table-top X-ray sources 1 should be made, using an efficient configuration. In this paper, we report on a meter-sized spectrometer being improved not only in this way, but also toward an enhanced resolving power.…”
Section: Introductionmentioning
confidence: 99%
“…This enables recording a spectrum with retaining one dimension for spatial imaging, similar to commonly used Varied Line-Spaced (VLS) grating. In contrast to a VLS, an RZP on a curved substrate offers a high efficiency up to 25% in a large spectral range covering photon energies of up to 1300 eV [58].…”
Section: Reflection Zone Plate Opticsmentioning
confidence: 99%
“…To overcome this limitation, a special "misalignment" technique has been proposed tuning the focused wavelength of a planar RZP over a broader spectral range [50,57]. Another option to obtain a high spectral resolution over a wide photon energy range is to fabricate RZP structures on a spherical substrate [58]. In contrast to an RZP on a planar substrate, the new design allows a high spectral resolution of up to ΔE/E = 1000 on the detector for a wide spectral range (designenergy ± 50%) without an energy-dependent spatial and spectral limited focusing.…”
Section: Reflection Zone Plate Opticsmentioning
confidence: 99%
“…The main references concerning a possible optical layout solution is the RZPA spectrometer as published in [7,8]. Recent advancements with RZPAs on a spherical substrate are reported in [9]. As an option, the RZPA provides up to four different RZPs, each with the same resolving power, together covering the energy range (150 -700) eV with HHG source and (210 -1400) eV with LPP source.…”
Section: Reflection Zone Plate Spectrometermentioning
confidence: 99%