2019
DOI: 10.1103/physrevapplied.11.054070
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Flipping-Coin Experiment to Study Switching in Josephson Junctions and Superconducting Wires

Abstract: When probed with current pulses, Josephson junctions and superconducting wires exhibit stochastic switching from a superconducting to a stable nonzero-voltage state. The electrical current dependence of the switching probability (the so-called S curve) or the switching-current distribution is a fingerprint of the physics governing the escape process. This work addresses the criterion of the independent switching event, which is important for the credibility of the switching measurements of superconducting wire… Show more

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Cited by 8 publications
(12 citation statements)
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“…V of the Ref. [23]. For completeness of our presentation we analyze these data once again in the current paper, introducing as a new element quantification of the phonon overheating due to a single switching event.…”
Section: Two Thermal Relaxation Timesmentioning
confidence: 99%
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“…V of the Ref. [23]. For completeness of our presentation we analyze these data once again in the current paper, introducing as a new element quantification of the phonon overheating due to a single switching event.…”
Section: Two Thermal Relaxation Timesmentioning
confidence: 99%
“…3(c)]. This relaxation is governed by electron-phonon coupling and by hot-electron diffusion [22,23]. Both energy-relaxation channels bring electrons into thermal equilibrium with phonons.…”
Section: Two Thermal Relaxation Timesmentioning
confidence: 99%
See 1 more Smart Citation
“…We use and further develop nanosecond thermometry based on stochastic switching of a Josephson junction from superconducting to normal state [16,34]. A particular type of Josephson junction, a superconducting aluminum nanobridge known in the literature as the Dayem bridge, is well tailored for tracing rapid changes in temperature, which are expected when hot electrons propagate across the nanostructure.…”
Section: Switching Thermometrymentioning
confidence: 99%
“…Collection of P(I test ) dependences at different temperatures gives knowledge of δP/δI test and dI sw /dT e , and allows us to calculate the temperature responsivity at constant testing current amplitude ( P/ T e ) I test . The uncertainty in T e determination is set by accuracy of probability measurement [34], that is P un = [P(1 − P)/N ] 1/2 (N is number of pulses) and reads T e,un = (−δP/δI test × dI sw /dT e ) −1 P un . The method is applicable only for linear regime when P ∼ T e .…”
Section: A Temperature From Probabilitymentioning
confidence: 99%