Fluctuation-Induced Tunneling Conduction in Carbon-Polyvinylchloride Composites

Sheng, Ping; Sichel, E. K.; Gittleman, J. I.

doi:10.1103/physrevlett.40.1197

Cited by 596 publications

(373 citation statements)

References 12 publications

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“…Experimentally, the locations of such hot spots (incomplete pinholes) may be identified by mapping the tunnel current over the lateral area A d , e.g., from conducting atomic force microscopy study at room temperature. 21,22 Alternatively, the occurrence of such hot spots can substantiate the FITC process in a wide T range from liquid-helium temperatures to room temperature, 14, 15 as we demonstrate below in micrometer-sized Al/AlO x /Y tunnel junctions.…”

Section: Experimental Methodsmentioning

confidence: 94%

“…2(b) unambiguously indicates that the conductances of the junctions C and D significantly deviate from the Simmons law. In the phenomenological FITC theory, at small bias voltages (i.e., the ohmic I-V regime), the R(T) of a small junction is described by 14,15 …”

Section: G S (T )mentioning

confidence: 99%

“…The current flowing through the hot spots between two large metal grains is theoretically found to depend sensitively not only on the applied bias voltage V a but also on the thermal voltage V T across the hot spots, where V T = ± √ k B T /C, with k B being the Boltzmann constant, and C being the capacitance of the hot spots. 14,15 (The plus/minus sign in V T stresses the fact that V T can be in the same/opposite direction to V a .) Owing to the smallness of the hot spot, the magnitude of C is tiny and thus V T is notable.…”

Section: Introductionmentioning

confidence: 99%

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Observation of fluctuation-induced tunneling conduction in micrometer-sized tunnel junctions

Lai

Lin

et al. 2012

AIP Advances

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Micrometer-sized Al/AlOx/Y tunnel junctions were fabricated by the electron-beam lithography technique. The thin (≈ 1.5–2 nm thickness) insulating AlOx layer was grown on top of the Al base electrode by O2 glow discharge. The zero-bias conductances G(T) and the current-voltage characteristics of the junctions were measured in a wide temperature range 1.5–300 K. In addition to the direct tunneling conduction mechanism observed in low-G junctions, high-G junctions reveal a distinct charge transport process which manifests the thermally fluctuation-induced tunneling conduction (FITC) through short nanoconstrictions. We ascribe the experimental realization of the FITC mechanism to originating from the formations of “hot spots” (incomplete pinholes) in the AlOx layer owing to large junction-barrier interfacial roughness

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Section: Experimental Methodsmentioning

confidence: 94%

Section: G S (T )mentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Observation of fluctuation-induced tunneling conduction in micrometer-sized tunnel junctions

Lai

Lin

et al. 2012

AIP Advances

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“…13 Such high values of resistance are attributed to a polymer coating that surrounds each of the nanotubes and acts as a high tunnel junction. Variations in the thickness of the polymer coatings, as well as nanotube-nanotube separation, varies the tunnel barrier and this fluctuation induced tunneling 14 ͑FIT͒ determines the intertube transport. A characteristic of FIT is that the log͑conductivity͒ within the film should vary as −p −1/3 .…”

Section: ͑1͒mentioning

confidence: 99%

Charge transport effects in field emission from carbon nanotube-polymer composites

Smith

Carey

Murphy

et al. 2005

Applied Physics Letters

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Electron field emission measurements have been made on multiwall arc discharge carbon nanotubes embedded in a conjugated polymer host. Electron emission at low nanotube content is observed and attributed to an enhancement of the applied electric field at the polymer/nanotube/vacuum interface where the electron supply through the film is attributed to fluctuation induced tunneling in a disordered percolation network. A high network resistance is attributed to a polymer coating surrounding each nanotube, resulting in high resistance nanotube-polymer-nanotube tunnel junctions. The potential use of carbon nanotube-polymer composites for field emission based displays is also discussed. © 2005 American Institute of Physics. ͓DOI: 10.1063/1.2158023͔Electron field emission based displays ͑FEDs͒ are highly attractive from a technological viewpoint for the next generation of displays. 1 Considerable research is currently being undertaken to find alternative cathode materials that emit electrons at relatively low applied electric fields. The discovery 2 of carbon nanotubes ͑CNTs͒ inevitably led to the use of CNTs as potential electron sources 3 and the subsequent development of a prototype FED. 4 In addition, electron emission from carbon nanofibers grown on low temperature substrates has also been demonstrated. 5 Optimizing emission from CNTs is an important technological goal due to the relatively high current production costs of nanotubes. To that end, the previous report of emission from CNTs, with mass fractions of 11%-33% embedded in a polystyrene matrix, is therefore important since the use of a composite structure potentially allows a lower concentration of nanotubes to be used. 6 The concept of an emitter based material embedded in a host matrix can be originally traced back to the pioneering work of Latham. 7 This approach has been recently revived by the incorporation of conductive graphitic particles into a nonconductive epoxy matrix to form metal-insulator-metalinsulator-vacuum cathodes. 8 In these electrically inhomogeneous cathodes, tailoring the concentration of the conductive phase, as a means to control charge transport, is an important issue. For flat metals, while there is an abundance of electrons, the absence of a surface geometric enhancement factor coupled with a high surface potential barrier ͑work function͒ results in the need for a high electric field ͑Ͼ200 V / m͒ to be applied for emission. In DLC films, emission has been described in terms of transport of electrons by hopping between conductive sp 2 clusters. 9 From these examples, it is evident that charge transport and emission of electrons are intrinsically linked. In this letter we report on the field emission characteristics of multiwall carbon nanotube-conjugated polymer composites as a function of nanotube loading. We show how the threshold field for emission decreases with nanotube loading and the transport of charge through a disordered percolation network.Composite solutions of conjugated polymer poly͑m-phenylenevinylene-co-2,5-diocty...

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“…Electrical conduction in a nanocomposite consisting of the conductive and the insulative phases is usually attributed to electrical network and the percolation, in which the continuous conducting network or tunneling between isolated conducting particles would be concomitant [16]. A finite conductivity is ascribed to the inter-particles tunneling through the dielectric regime in the absence of metallic continuum.…”

Section: Introductionmentioning

confidence: 99%

Buildup of Sn@CNT nanorods by in-situ thermal plasma and the electronic transport behaviors

Wang

Javid

et al. 2018

Sci. China Mater.

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Fluctuation-Induced Tunneling Conduction in Carbon-Polyvinylchloride Composites

Cited by 596 publications

References 12 publications

Observation of fluctuation-induced tunneling conduction in micrometer-sized tunnel junctions

Observation of fluctuation-induced tunneling conduction in micrometer-sized tunnel junctions

Charge transport effects in field emission from carbon nanotube-polymer composites

Buildup of Sn@CNT nanorods by in-situ thermal plasma and the electronic transport behaviors

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