Fluctuations of the number of adsorbed molecules due to adsorption–desorption processes coupled with mass transfer and surface diffusion in bio/chemical MEMS sensors

Djurić, Z.; Jokić, Ivana; Peleš, Adriana

doi:10.1016/j.mee.2014.06.001

Cited by 12 publications

(16 citation statements)

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“…Random Number Generator (RNG) is implemented as a stable generator of digitally synthesized random voltage. RNG outputs to a 12-bit D/A converter, which produces a uniform noise signal s p limited within ±2,5 V. Both RNG and D/A converter operate at 125 kHz rate, which covers most types of lowfrequency noise met in latest graphene-based sensors [15][16][17][18]. The generated noise s p is then adjusted with a voltage divider (potentiometer P) to give a noise signal s, which is simultaneously measured by the proposed experimental device (shown in Fig.…”

Section: Resultsmentioning

confidence: 99%

“…This resembles the noise encountered in application of the emerging graphene-based sensors [15][16][17][18], where the noise is the signal that needs to be measured. Hence, this experiment has a practical significance as it proves a possibility of utilizing the stochastic measurement approach in conjunction with graphene-based sensors.…”

Section: Discussionmentioning

confidence: 99%

“…One of them is the latest technology of graphenebased chemical and biological sensors [15][16][17][18], where the interaction between the substance molecules and the graphene sensor surface molecules creates a lowfrequency noise. Physical principles of unique identification of chemical or biological substance by a graphene sensor are described in [15].…”

Section: Introductionmentioning

confidence: 99%

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Stochastic measurement of noise true RMS using two-bit flash A/D converters

Sovilj

Vujičić

Sokola³

et al. 2017

Teh. vjesn.

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Original scientific paper The paper presents an application of the stochastic measurement approach for true RMS and power of noise. The instrument structure is based on two 2-bit flash analog-to-digital (A/D) converters whose inputs are the dithered noise, and on accumulation of the product of the converters' outputs. New theoretical expressions for predicting measurement result and measurement uncertainty, with inclusion of input signal's stochastic nature, are derived. Extensive simulations and experiments prove the validity of the proposed method and its low measurement uncertainty, even at a relatively low sampling rate. These indicate that, beside general applications for noise measurements, the instrument is suitable for chemical and biological substances detection that utilizes graphene sensors. Keywords: digital measurements; measurement uncertainty; noise measurement; stochastic processes Stohastičko mjerenje efektivne vrijednosti šuma dvo-bitnim flash A/D konvertorimaIzvorni znanstveni članak U ovom radu je predstavljena primjena pristupa stohastičkog mjerenja u mjerenju efektivne vrijednosti i snage šuma. Struktura instrumenta je zasnovana na dva dvo-bitna flash analogno-digitalna (A/D) konvertora, na čije ulaze se dovodi diterovani šum, i na akumulaciji proizvoda konvertorskih izlaza. Izvedeni su novi teorijski izrazi za predviđanje rezultata mjerenja i mjerne nesigurnosti, koji uključuju stohastičku prirodu ulaznih signala. Ekstenzivne simulacije i eksperimenti dokazuju validnost predložene metode i njenu nisku mjernu nesigurnost, čak i pri relativno niskoj frekvenciji uzorkovanja. Ovo ukazuje da je prikazani instrument, osim za opću primjenu u mjerenju šuma, pogodan i za detekciju kemijskih i bioloških tvari, zasnovanu na upotrebi grafenskih senzora.

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Section: Resultsmentioning

confidence: 99%

Section: Discussionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Stochastic measurement of noise true RMS using two-bit flash A/D converters

Sovilj

Vujičić

Sokola³

et al. 2017

Teh. vjesn.

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“…Alternatively, expressions developed in [21] can be used if bi-component monolayer adsorption occurs. One could also use another appropriate expression for the power spectral density of resonator mass fluctuations caused by various adsorption-desorption processes (arbitrary mixture of gases [28], multilayer adsorption [29], adsorption-desorption processes coupled with mass transfer and surface diffusion [30], etc. ).…”

Section: Phase Noise Induced By Mass Fluctuationsmentioning

confidence: 99%

Joint Effect of Heterogeneous Intrinsic Noise Sources on Instability of MEMS Resonators

Jakšić¹,

Jokić²,

Frantlović³

et al. 2016

ELS

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This article's focus is on the numerical estimation of the overall instability of microelectromechanical-system-based (MEMS) resonators, caused by intrinsic noise mechanisms that are different in nature (electrical, mechanical or chemical). Heterogeneous intrinsic noise sources in MEMS resonators that have been addressed here are Johnson–Nyquist noise, 1/f noise, noise caused by temperature fluctuations and adsorptiondesorption induced noise. Their models are given first (based on analytical modeling or based on empirical expressions with experimentally obtained parameters). Then it is shown how each one contributes to the phase noise, a unique figure of merit of resonators instability. Material dependent constants  and knee position in noise spectrum, needed for empirical formulae referring to 1/f noise, have been obtained experimentally, by measurements of noise of MEMS components produced in the Centre of Microelectronic Technologies of the Institute of Chemistry, Technology and Metallurgy in Belgrade. According to these measurements,  varies in the range from 0.776.10-4 to 2.26.10-4 and cut off frequency for 1/f noise varies from 147 Hz to 1 kHz. The determined values are then used for the modeling of micro-resonator phase noise with electrical origin and overall phase noise of a micro-resonator. Numerical example for calculation of overall phase noise is given for a micro-cantilever, produced by the same technology as measured components. The outlined noise analysis can be easily extended and applied to noise analysis of MEMS resonator of an arbitrary shape.

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“…Microbeams, as the most widely used microscale continuous elements, can be found in various microelectromechanical devices [2]. Nowadays, the usage of beam-shaped structures has widely spread in micro and nano electromechanical systems (MEMS and NEMS) as elements such shock sensors [3], micro-actuators [4], accelerometers [5], bio-MEMS [6], atomic force microscopes, and so on [7,8]. The critical physical dimensions of MEMS devices can vary from well below one micron on the lower end of the dimensional spectrum, all the way to several millimeters.…”

Section: Introductionmentioning

confidence: 99%

A practical method for calculating eigenfrequencies of a cantilever microbeam with the attached tip mass

Yaylı¹,

Kandemir²,

Çerçevik³

2016

J. vibroeng.

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This paper is concerned with the free vibration of cantilever microbeams with attached tip mass in a systematical manner. Small size effects on the vibrations of the microbeam are taken into consideration by introducing a scale parameter. A Fourier sine series is used to represent the lateral displacement function. Stokes' transformation is applied in the present formulation and corresponding derivatives are presented explicitly. The present formulations can be readily reduced to those for others classical elasticity models by setting corresponding small scale parameter to zero. Several parametric studies are performed to validate the present solutions and the effects of various important physical parameters (scale parameter, tip mass) are investigated.

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Fluctuations of the number of adsorbed molecules due to adsorption–desorption processes coupled with mass transfer and surface diffusion in bio/chemical MEMS sensors

Cited by 12 publications

References 11 publications

Stochastic measurement of noise true RMS using two-bit flash A/D converters

Stochastic measurement of noise true RMS using two-bit flash A/D converters

Joint Effect of Heterogeneous Intrinsic Noise Sources on Instability of MEMS Resonators

A practical method for calculating eigenfrequencies of a cantilever microbeam with the attached tip mass

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