1971
DOI: 10.1016/0022-3115(71)90111-5
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Fluence and flux dependence of void formation in pure aluminum

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Cited by 54 publications
(10 citation statements)
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“…n/om 2 causes 7.5$ swelling in high purity aluminum. 12 Silicon is generated in all of these materials but the major differences in swelling arise from differences in the total volume of voids. …”
mentioning
confidence: 99%
“…n/om 2 causes 7.5$ swelling in high purity aluminum. 12 Silicon is generated in all of these materials but the major differences in swelling arise from differences in the total volume of voids. …”
mentioning
confidence: 99%
“…We expect that we are close to the fluence threshold for void formation on the basis of work done by Packen. (25) 19 2 He'' found that no voids could be formed below 1.5 x 1 0 n/cm which is roughly 0.2 dpa using reported displacement cross section for Al. Since the majority of the present work was conducted at dpa levels of 0.26 to 0.68 dpa, the fluence argument appears to most plausible at the present time.…”
Section: Discussion Imentioning
confidence: 99%
“…For helium concentrations much below that value, void nucleation in extremely pure metals (like the Al used in this study) is governed by homogeneous nucleation and that rate is obviously not high enough in the temperature-damage range of these studies to produce visable voids. It is interesting to note that Packen found a threshold for void formation at (25) 19 -2 -1 -3 1.5 x 10 n cm sec which corresponds to 6 x 10 appm helium ·…”
Section: Discussion Imentioning
confidence: 99%
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