2003
DOI: 10.1016/s0022-1139(03)00074-5
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Fluorine—an enabler in advanced photolithography

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Cited by 17 publications
(20 citation statements)
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“…1, 2 In specific applications such as photomasks for lithography at 157 nm and materials for vuv sources, silicalike structural features are unique in assuring low thermal expansion coefficient and good workability. 3 For these reasons, modifications of silica optical properties through specific synthesis or doping processes are currently being investigated to extend its operational window into the vuv. Fluorine modified silica-based materials are promising candidates for these applications, since the silica absorption edge shifts toward high energy after fluorine doping.…”
mentioning
confidence: 99%
“…1, 2 In specific applications such as photomasks for lithography at 157 nm and materials for vuv sources, silicalike structural features are unique in assuring low thermal expansion coefficient and good workability. 3 For these reasons, modifications of silica optical properties through specific synthesis or doping processes are currently being investigated to extend its operational window into the vuv. Fluorine modified silica-based materials are promising candidates for these applications, since the silica absorption edge shifts toward high energy after fluorine doping.…”
mentioning
confidence: 99%
“…The next step, then in preparation, was down to 157 nm (F 2 laser) [13]. The next step, then in preparation, was down to 157 nm (F 2 laser) [13].…”
Section: Polymers and Lubricants 253mentioning
confidence: 99%
“…The characteristic of polymers developed for 157 nm lithography is the high fluorine content, which considerably increases the transparency at the exposure wavelength [55][56][57][58][59][60][61][62][63]. Usually, these polymers are co,-ter-, or tetra-polymers, containing monomers that bring specific properties to the material.…”
Section: Polymers For 157 Nm Optical Lithographymentioning
confidence: 99%