“…The dimensionless magnetic flux h ¼ HS 1=2 =U 0 is measured in units of magnetic flux quantum per smallest loop area of the array. In the simulations, we also considered the effect of two types of structural fluctuations related to the JJ-arrays: (i) critical current fluctuations from junction to junction D J , with the average hD J i ¼ 0, i.e., I cn of the nth junction can vary randomly from the designed value (due to inhomogeneities of the bicrystal line 41 ) resulting in fluctuations of j cn ¼ I cn = I c h i; (ii) fluctuations in the array loop areas D A , with the average hD A i ¼ 0, due to the 1 lm finite resolution of photolithography used in the fabrication process. Finally, thermal fluctuations have been considered too: temporal unbiased d-correlated Gaussian white noise n n with intensity D, i.e., n n h i ¼ 0; n n ð0Þn n ðtÞ ¼ dðtÞ, which can occur, for instance, due to thermal noise or temporal current fluctuations of the external circuit.…”