2012
DOI: 10.3762/bjnano.3.70
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Focused electron beam induced deposition: A perspective

Abstract: Summary Background: Focused electron beam induced deposition (FEBID) is a direct-writing technique with nanometer resolution, which has received strongly increasing attention within the last decade. In FEBID a precursor previously adsorbed on a substrate surface is dissociated in the focus of an electron beam. After 20 years of continuous development FEBID has reached a stage at which this technique is now particularly attractive for several areas in both, basic and applied research. The present topical review… Show more

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Cited by 246 publications
(320 citation statements)
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“…Here we notice that understanding the reason for the sharp transition of Fig. 1 involves the solution of a system of Langmuir differential adsorption rate equations and the knowledge of the related adsorption, diffusion, desorption and decomposition parameters [19,23,24], which is beyond the aim of the present work. However, as an hint for future investigations, we observe that the residence time of Si 5 H 12 in the SEM was rather long, since it was possible to grow Si-based deposits for some hours after having close the relative Si 5 H 12 dosimeter.…”
Section: Discussionmentioning
confidence: 99%
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“…Here we notice that understanding the reason for the sharp transition of Fig. 1 involves the solution of a system of Langmuir differential adsorption rate equations and the knowledge of the related adsorption, diffusion, desorption and decomposition parameters [19,23,24], which is beyond the aim of the present work. However, as an hint for future investigations, we observe that the residence time of Si 5 H 12 in the SEM was rather long, since it was possible to grow Si-based deposits for some hours after having close the relative Si 5 H 12 dosimeter.…”
Section: Discussionmentioning
confidence: 99%
“…This picture is maintained until the flux of F e(CO) 5 Electron irradiation has been used to induce phase transformations in bulk and low dimensional systems [27,28], and to tune the physical properties of graphene and carbon nanotubes [29]. In a series of recent papers we have started to investigate the effects of electron beam irradiation on the microstructure of FEBID samples [19]. For example, it was shown that during electron-beam irradiation the carbon-like matrix of Pt-C nanocomposites tends to graphitize, while the intergrain distance of the P t nanograins is reduced, which is due to carbon removal and to an increase of the diameter of the grains [30].…”
Section: Discussionmentioning
confidence: 99%
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“…Sensitive Hall sensor devices have been developed employing Cobased structures obtained with the precursor CO 2 (CO) 8 with excellent sensitivity for local magnetic stray field detection [1,2]. The development of miniaturized strain and force sensors followed next which took advantage of the nano-granularity of Pt(C)-based FEBID structures obtained from the precursor CH 3 CpCH 3 Pt (Cp: cyclopentadienyl) [3] and proved to be highly interesting for atomic force microscopy sensors [4]. The working principle for the exploited strain-resistance effect was found to be rooted in the sensitive dependence of the hopping transport between the metallic Pt nano-grains of about 3 nm diameter through a carbonaceous matrix [5].…”
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confidence: 99%