2007
DOI: 10.1557/mrs2007.62
|View full text |Cite
|
Sign up to set email alerts
|

Focused Ion Beam Microscopy and Micromachining

Abstract: The fairly recent availability of commercial focused ion beam (FIB) microscopes has led to rapid development of their applications for materials science. FIB instruments have both imaging and micromachining capabilities at the nanometer–micrometer scale; thus, a broad range of fundamental studies and technological applications have been enhanced or made possible with FIB technology. This introductory article covers the basic FIB instrument and the fundamentals of ion–solid interactions that lead to the many un… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

4
393
0
11

Year Published

2008
2008
2019
2019

Publication Types

Select...
5
4

Relationship

0
9

Authors

Journals

citations
Cited by 583 publications
(408 citation statements)
references
References 29 publications
4
393
0
11
Order By: Relevance
“…The most prevalent method to fabricate pillars is by focused ion beam (FIB) [1][2][3][4][5][6][7][8][9]14,[16][17][18][19][20][21][22][25][26][27]. Remarkably, at these length scales, face-centered cubic (fcc) metallic nanopillars exhibit a strong size-dependent strengthening: as the pillar diameter becomes smaller, its flow stress increases as a power law: / d Àn where d is the pillar diameter and n lies between 0.5 and 0.7 [1- 7,11,23,26].…”
mentioning
confidence: 99%
“…The most prevalent method to fabricate pillars is by focused ion beam (FIB) [1][2][3][4][5][6][7][8][9]14,[16][17][18][19][20][21][22][25][26][27]. Remarkably, at these length scales, face-centered cubic (fcc) metallic nanopillars exhibit a strong size-dependent strengthening: as the pillar diameter becomes smaller, its flow stress increases as a power law: / d Àn where d is the pillar diameter and n lies between 0.5 and 0.7 [1- 7,11,23,26].…”
mentioning
confidence: 99%
“…5,6 In a typical FIB system, Ga + ions are extracted from a liquid-metal ion source, accelerated to 30 keV, and focused by an electrostatic lens system to a spot size with diameter as small as 5 -10 nm.…”
mentioning
confidence: 99%
“…More details on the scanning electron microscopy, electron beam lithography and lift-off techniques are available in Refs [8,22,23,56].…”
Section: Methodsmentioning
confidence: 99%