Handbook of Microscopy for Nanotechnology
DOI: 10.1007/1-4020-8006-9_9
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Focused Ion Beam System—a Multifunctional Tool for Nanotechnology

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Cited by 8 publications
(2 citation statements)
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“…Generally, for preparing a TEM specimen of nanopowders, TEM microgrid is used, and the powders are dispersed on the surface of the grid which coated with thin carbon or holey carbon film. [1][2][3][4][5][6][7][8] But for small particles with a size comparable to the thickness of the supporting film, especially those less than 5 nm in diameter, it is difficult to gain clear HRTEM images due to the influence of scattering from the amorphous carbon film of the support grid. To overcome this difficulty, efforts improving the construction of the supporting grid have been researched.…”
mentioning
confidence: 99%
“…Generally, for preparing a TEM specimen of nanopowders, TEM microgrid is used, and the powders are dispersed on the surface of the grid which coated with thin carbon or holey carbon film. [1][2][3][4][5][6][7][8] But for small particles with a size comparable to the thickness of the supporting film, especially those less than 5 nm in diameter, it is difficult to gain clear HRTEM images due to the influence of scattering from the amorphous carbon film of the support grid. To overcome this difficulty, efforts improving the construction of the supporting grid have been researched.…”
mentioning
confidence: 99%
“…We should mention that the SEM technique is outside the scope of this work, but more information can be found in Ref. (93). AFM images were acquired to better understand the morphology of our devices when the monolayer is deposited over the metallic gratings.…”
Section: Morphological Characterization Of Mos 2 /Au Hybrid Devicementioning
confidence: 99%