Focused ion beams techniques for nanomaterials characterization

Langford, R. M.

doi:10.1002/jemt.20324

Cited by 114 publications

(76 citation statements)

References 63 publications

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“…The temperature at which the specimen is cut varied from −150 °C (ghosh et al, 2000) to −55 °C . Another recently developed method is the focused ion beam (FIB) technique, which allows very thin sections to be obtained and does not require embedding (Langford, 2006). Rapid freezing is also important for preserving the spatial integrity of samples.…”

Section: Sample Preparationmentioning

confidence: 99%

Synchrotron‐Based Near‐Edge X‐Ray Spectroscopy of Natural Organic Matter in Soils and Sediments

Lehmann

Solomon

Brandes

et al. 2009

Biophysico‐Chemical Processes Involving Natural Nonliving Organic Matter in Environmental Systems

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SyNCHROTRON-BASED NEAR-EDgE X-RAy SPECTROSCOPy discrete radii indexed by a principal quantum number n = 1,2,3 …, and discrete binding energies for single-electron atoms of E n = −E 0 Z 2 /n 2 , where Z is the atomic number and E 0 = 13.6 eV (see Figure 17.1). When the energy of incident photons is increased to match the binding energy of an electron, the photon absorption probability suddenly increases in what is called an X-ray absorption edge (step function in Figure 17.2, which is at about 290 eV for carbon), so that the electron is completely removed from the atom in an ionization event (absorption edges are also labeled figure 17.1. Atom in the Bohr model. The electrons surround the nucleus. An incoming photon can lift an electron to a not fully occupied, higher orbital or remove it entirely from the atom. Energy (eV)280 285 290 295 300 Normalized absorption Measured ModeledStep functionfigure 17.2. Carbon NEXAFS spectrum of NOM from the Suwannee River (IHSS standard humic acid mounted on indium foil; total electron yield using a dwell time of 200 msec and an exit slit of 50 µm, calibrated to CO at 287.38 eV, Canadian Light Source SgM beamline 11-ID.1) to show pre-edge features and the so-called "edge". The spectrum is deconvoluted using a series of gaussian curves (g) at energy positions of known transitions, along with a step function at the edge as described by .

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Section: Sample Preparationmentioning

confidence: 99%

Synchrotron‐Based Near‐Edge X‐Ray Spectroscopy of Natural Organic Matter in Soils and Sediments

Lehmann

Solomon

Brandes

et al. 2009

Biophysico‐Chemical Processes Involving Natural Nonliving Organic Matter in Environmental Systems

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“…And a Ga þ implantation and damage occurring in surface of the micropillar creates a damage layer with a thickness of 10-100 nm. 18,19) This damage layer may strengthen the specimen by restricting the emission of dislocation from the surface. 20,21) To evaluate the influence of this layer in the mechanical behavior of nc-Ni, chemical analysis of the longitudinal section of deformed nc-Ni is carried out.…”

Section: Discussionmentioning

confidence: 99%

TEM Sample Preparation for Microcompressed Nanocrystalline Ni

et al. 2008

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Ultra-large compressive plasticity at room temperature has recently been observed in electrodeposited nanocrystalline nickel (nc-Ni) under micro-scale compression (Pan, Kuwano, Fujita, Chen, Nano Letters 7, 2108). The evolution of microstructure of nc-Ni during ultra-large deformation is outlined at a variety of strain levels, with TEM observations in combination with a TEM sample preparation technique using focused ion beam (FIB).This paper demonstrates focused ion beam (FIB) technique to prepare transmission electron microscopy (TEM) samples from microcompressed specimens. There has been a demand to prepare TEM samples from a point of interest to study microstructures on atomic scales. Conventional techniques used to make TEM samples, such as chemical polishing or ion-sputtering milling, cannot provide reliable opportunity to make TEM samples from a point of interest. With this technique, the deformation mechanism on atomic scales can be fairly connected with the result of microcompression test, which is available for size-limited materials.

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“…This results in a roughness within the slice plane and thus slice milling with inconsistent thickness. This is particularly the case when the sample surface has a rough topography or the material contains phases with different densities [60,63]. This effect is greatly reduced by depositing a thick Pt layer on the top surface above the ROI by in situ FIB assisted deposition, followed by gentle ion milling (polishing using a relatively low ion beam).…”

Section: Tomography Setupmentioning

confidence: 99%

Nano-Tomography of Porous Geological Materials Using Focused Ion Beam-Scanning Electron Microscopy

Liu

Huis

et al. 2016

Minerals

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Tomographic analysis using focused ion beam-scanning electron microscopy (FIB-SEM) provides three-dimensional information about solid materials with a resolution of a few nanometres and thus bridges the gap between X-ray and transmission electron microscopic tomography techniques. This contribution serves as an introduction and overview of FIB-SEM tomography applied to porous materials. Using two different porous Earth materials, a diatomite specimen, and an experimentally produced amorphous silica layer on olivine, we discuss the experimental setup of FIB-SEM tomography. We then focus on image processing procedures, including image alignment, correction, and segmentation to finally result in a three-dimensional, quantified pore network representation of the two example materials. To each image processing step we consider potential issues, such as imaging the back of pore walls, and the generation of image artefacts through the application of processing algorithms. We conclude that there is no single image processing recipe; processing steps need to be decided on a case-by-case study.

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Focused ion beams techniques for nanomaterials characterization

Cited by 114 publications

References 63 publications

Synchrotron‐Based Near‐Edge X‐Ray Spectroscopy of Natural Organic Matter in Soils and Sediments

Synchrotron‐Based Near‐Edge X‐Ray Spectroscopy of Natural Organic Matter in Soils and Sediments

TEM Sample Preparation for Microcompressed Nanocrystalline Ni

Nano-Tomography of Porous Geological Materials Using Focused Ion Beam-Scanning Electron Microscopy

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