Chem. Commun.
 2024
DOI: 10.1039/d4cc03658a
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Footprints of scanning probe microscopy on halide perovskites

Shresth Gupta,
Sayan Bhattacharyya

Abstract: Scanning probe microscopy (SPM) and advanced atomic force microscopy (AFM++) are essential for in situ and ex situ nanoscale investigations of the structural, optoelectronic, and photovoltaic properties of halide perovskite crystals and films.

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