Force–distance studies with piezoelectric tuning forks below 4.2 K

Rychen, J.; Ihn, Thomas; Studerus, P.; Herrmann, A.; Ensslin, Klaus; Hug, H. J.; Schendel, P. J. A. van; Güntherodt, H.‐J.

doi:10.1016/s0169-4332(99)00541-3

Cited by 39 publications

(37 citation statements)

References 15 publications

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“…Scanning is performed with an electrochemically etched metallic tip attached to the end face of one prong of a piezoelectric quartz tuning fork [8,9,10,11,12].…”

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confidence: 99%

“…Therefore the setup relies on a piezoelectric measurement of the tip oscillation utilizing a phase-locked loop measuring the change in resonance frequency upon changes in the tip-sample interaction [13,14]. The relative accuracy of the frequency detection is better than 10 −7 [7,11,15]. In a dynamic mode SPM at small tip oscillation amplitudes, the measured frequency shift ∆f does not directly reflect the force F ts acting on the cantilever, but rather the force gradient [13] ∆f ∝ dF ts dz =:…”

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confidence: 99%

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Kelvin probe spectroscopy of a two-dimensional electron gas below 300 mK

Vancura

Kicin

Ihn

et al. 2003

Applied Physics Letters

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A scanning force microscope with a base temperature below 300 mK is used for measuring the local electron density of a two-dimensional electron gas embedded in an Ga[Al]As heterostructure. At different separations between AFM tip and sample, a dc-voltage is applied between the tip and the electron gas while simultaneously recording the frequency shift of the oscillating tip. Using a plate capacitor model the local electron density can be extracted from the data. The result coincides within 10 % with the data obtained from transport measurements.

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“…Scanning is performed with an electrochemically etched metallic tip attached to the end face of one prong of a piezoelectric quartz tuning fork [8,9,10,11,12].…”

mentioning

confidence: 99%

mentioning

confidence: 99%

Kelvin probe spectroscopy of a two-dimensional electron gas below 300 mK

Vancura

Kicin

Ihn

et al. 2003

Applied Physics Letters

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“…One can show [73,74] From the above analysis, one sees that the choice of a resonator is a balance between greater stiffness which gives better stability of operation and lower stiffness which gives better overall sensitivity. Quartz tuning forks being much stiffer than conventional cantilevers, they are very stable and convenient to use in AFM: they are not easily prone to jump-to-contact or hysteretic behavior upon a change of amplitude.…”

Section: 432mentioning

confidence: 99%

“…In the PLL case, which is of interest to us, the response time is limited by the speed at which one can measure the changes in the phase of the oscillation [73,74,77]. Of course, this speed has a tradeoff with the stability of the frequency, and therefore with the sensitivity and the accuracy of the force measurement.…”

Section: "Force" Measurements: Detection Schemesmentioning

confidence: 99%

Cryogenic AFM-STM for mesoscopic physics

Sueur

2008

Ann. Phys. Fr.

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Electronic spectroscopy based on electron tunneling gives access to the electronic Density of States (DoS) in conductive materials, and thus provides detailed information about their electronic properties. During this thesis work, we have developed a microscope in order to perform spatially resolved (10 nm) tunneling spectroscopy, with an unprecedented energy resolution (10 µeV), on individual nanocircuits. This machine combines an Atomic Force Microscope (AFM mode) together with a Scanning Tunneling Spectroscope (STS mode), and functions at very low temperatures (30mK). In the AFM mode, the sample topography is recorded using a piezoelectric quartz tuning fork, which allows locating and imaging nanocircuits. Tunneling can then be performed on conductive areas of the circuit. With this microscope, we have measured the local DoS in a hybrid Superconductor-Normal metal-Superconductor (S-N-S) structure. In such circuit, the electronic properties of N and S are modified by the superconducting proximity effect. In particular, for short N wires, we have observed a minigap in the DoS of the N wire, independent of position. Moreover, when varying the superconducting phase difference between the S electrodes, we have measured the modification of the minigap, and its disappearance when the phase difference equals π. Our experimental results for the DoS, and its dependences (with phase, position, N length) are quantitatively accounted for by the quasiclassical theory of superconductivity. Some predictions of this theory are observed for the first time. CRYOGENIC AFM-STM FOR MESOSCOPIC PHYSICSH COVER:The front cover shows an AFM image of a small circuit fabricated by electronic lithography and double angle evaporation, comprising a 350 nm long, 30 nm thick silver wire (colorized in orange) and a 60 nm thick aluminium half loop (dark grey). This structure has been imaged using an atomic force sensor, and tunneling spectroscopy was subsequently performed at several positions. Curves on the background are tunneling spectra measured for different values of the superconducting phase difference across the normal wire (at the location of the tip represented on the AFM image).The graph on the backside of the cover is a 3D plot of the predicted local density of states along a 1D S-N-S structure, with a normal wire length L = 1.4 ξ (corresponding to 350 nm), and perfect interfaces. Merci infiniment à Daniel Esteve, mon directeur de thèse, pour avoir appuyé sans réserve ma candidature, et tout ce qui s'en est suivi : Travailler avec un « chef » comme toi est un enrichissement extrême, tant pour ton recul sur la compréhension des phénomènes envisagés, que pour ton esprit pratique qui nous permet de parvenir plus vite (et mieux bien sûr !) au résultat souhaité… Et puis tu n'es pas chef pour rien : ce don d'ubiquité qui te permet de consacrer à tous les projets simultanément la même attention exclusive force sincèrement l'admiration ! J'espère avoir mérité toute la confiance que m'a accordée Philippe Joyez en me laissant la responsabili...

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“…Também foram reportadas medidas em líquidos [24], à baixa temperatura [38,58,59], e também foi utilizado para medidas de atrito [60]. Alguns desses resultados da literatura são apresentados na Figura 3.12.…”

Section: O Modo Tuning-forkunclassified

Cristais Osciladores De Quartzo Como Sensores Para Microscopia De Força Atômica

LEMOS¹

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AgradecimentosAo meu orientador, Rodrigo Prioli, mesmo com a distância sempre esteve disponível para resolver os problemas mais banais e as dúvidas mais triviais. Pelas discussões, pelo conhecimento e, não menos importante, pela paciência.À todos do grupo de Nanoscopia da PUC-Rio, o qual tive o prazer de fazer parte. À Paula, quem sempre me motivou durante o mestrado, e por toda a ajuda. À Elizandra, quem muito me ensinou e ajudou no começo. Ao Douglas, pelas discussões nos mais variados assuntos, acadêmicos ou não. Aos funcionários do Dep. de Física, em especial à Giza, por toda a ajuda nas questões burocráticas.Ao grupo do Laboratório de Optoeletrônica Molecular da PUC-Rio, em especial ao Harold, Rafael e Rian, pelas medidas na lupa.Ao Alexander, Jackes, Victor e ao Prof. Welles Morgado, pela Escola de Verão.Aos meus pais, por todo apoio, e ao meu irmão, pelas incontáveis caronas. Aos meus avós, por tudo. Ao meu padrinho Ernesto, pela ajuda financeira durante a graduação, e pelas discussões na mesa de jantar.À Pontifícia Universidade Católica, pela minha formação, a qual vai muito além do conhecimento acadêmico.À CAPES, ao CNPq e à FAPERJ pelo suporte financeiro, sem os quais este trabalho não poderia ter sido realizado. A caracterização de cristais osciladores de quartzo (QTF) foi realizada nesta dissertação com o objetivo de implementá-los como sensores de um microscópio de força atômica (AFM). O QTF possui várias vantagens em relação aos cantilevers tradicionais de silício. Utilizado em modos dinâmicos de operação do AFM, o QTF possui maior fator de qualidade e rigidez, permitindo melhor sensibilidade em força e o uso de baixas amplitudes de oscilação para imageamento do que cantilevers tradicionais. Nesse trabalho, parâmetros mecânicos e elétricos do QTF foram medidos. Além disto, um estudo da influência da adição de massa nos braços do QTF foi realizado. Para a implementação do QTF no AFM, um sistema de feedback composto de um amplificador lock-in e um amplificador diferencial foi desenvolvido e testado. Adicionalmente, um novo cabeçote para o microscópio foi desenvolvido para adaptar o QTF ao microscópio. The characterization of quartz tuning forks (QTF) was performed in this dissertation, aiming to implement them as sensors at an atomic force microscope (AFM). The QTF has several advantages over traditional silicon cantilevers. Used in dynamic AFM modes, the QTF has higher quality factor and stiffness, allowing better force sensitivity and lower amplitudes of oscillation for imaging than traditional cantilevers. In this work, electrical and mechanical parameters of the QTF were obtained. Furthermore, a study of the influence of additional mass on the QTF prongs was performed. To implement the QTF at the AFM, a feedback system composed of a lock-in amplifier and a differential amplifier was developed and tested. Additionally, a new microscope head was designed to adapt the QTF to the microscope. Palavras-chave

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Force–distance studies with piezoelectric tuning forks below 4.2 K

Cited by 39 publications

References 15 publications

Kelvin probe spectroscopy of a two-dimensional electron gas below 300 mK

Kelvin probe spectroscopy of a two-dimensional electron gas below 300 mK

Cryogenic AFM-STM for mesoscopic physics

Cristais Osciladores De Quartzo Como Sensores Para Microscopia De Força Atômica

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