Force modulation for improved conductive-mode atomic force microscopy

Koelmans, Wabe W.; Sebastian, Abu; Despont, M.; Pozidis, Haralampos

doi:10.1109/nano.2010.5697835

Cited by 3 publications

(3 citation statements)

References 10 publications

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“…Force-modulation schemes are shown to be beneficial for the endurance of conductive probes. Moreover, it has been demonstrated that when using force modulation lower, load forces are needed to obtain a good electrical tip-medium contact 73,74 . Given the severe limitations in writing amorphous regions in phase-change materials, the prospects for probe-based phase-change storage are dim.…”

Section: Endurancementioning

confidence: 99%

Probe-based data storage

Koelmans,

Engelen,

Abelmann

2015

Preprint

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Probe-based data storage attracted many researchers from academia and industry, resulting in unprecedented high data-density demonstrations. This topical review gives a comprehensive overview of the main contributions that led to the major accomplishments in probe-based data storage. The most investigated technologies are reviewed: topographic, phase-change, magnetic, ferroelectric and atomic and molecular storage. Also, the positioning of probes and recording media, the cantilever arrays and parallel readout of the arrays of cantilevers are discussed. This overview serves two purposes. First, it provides an overview for new researchers entering the field of probe storage, as probe storage seems to be the only way to achieve data storage at atomic densities. Secondly, there is an enormous wealth of invaluable findings that can also be applied to many other fields of nanoscale research such as probe-based nanolithography, 3D nanopatterning, solid-state memory technologies and ultrafast probe microscopy. B. Current status of probe storageThe maturity of the various types of probe storage differs significantly. Four popular types, namely phase change, magnetic, thermomechanical and ferroelectric storage are listed in table I.Probe-based data storage has attracted much scientific and commercial interest [18][19][20] . After more than two decades of research on probe storage, an overview of what has been accomplished so far, together with an outlook of the a)

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Section: Endurancementioning

confidence: 99%

Probe-based data storage

Koelmans,

Engelen,

Abelmann

2015

Preprint

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“…A similar technique was used to image delicate polymer surfaces and was shown to completely suppress the formation of the ripple wear patterns that are commonly observed when imaging these surfaces in contact-mode atomic force microscopy (AFM) [26]. More recently force modulation has also been shown to improve the electrical contact quality in conductive-mode AFM [27].…”

Section: Dynamic-mode Operationmentioning

confidence: 99%

Recent advances in high-throughput scanning-probe technology

Eleftheriou

2010

10th IEEE International Conference on Nanotechnology

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Widespread deployment of scanning-probe techniques in applications such as semiconductor metrology, lithography and data storage requires significant improvements in throughput, achievable resolution and probe and media reliability. One way to improve the throughput and reliability of probe-based devices is to employ an array of probes. However, for parallel operation of several cantilevers, integrated sensing and actuation are essential. Thermo-electric sensors and magnetoresistive sensors are excellent candidates for integrated sensing. Moreover, there is a need for improvements in nontopographical sensing schemes, such as electrical sensing. Finally, nanopositioning is another key enabling technology to achieve very high bandwidth and hence high throughput. Position sensor noise is detrimental to achieving nanoscale resolution at high bandwidth, and several techniques exist to mitigate the effect of sensing noise. Recently developed small-amplitude dynamic-mode techniques are also excellent for array operations owing to their simplicity of implementation. In this paper, we review recent key advances in high-throughput scanning-probe technology.

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“…In this paper we present a complementary strategy, a normal force modulation technique, to increase the reliability of nanoscale electrical contact and to reduce tip wear in conductive-mode SPM. The essential idea behind the proposed force modulation technique is to modulate the normal load force while the tip is in contact with the sample [20]. This modulation is achieved by actuating the cantilever at specific mechanical resonant frequencies which correspond to the normal modes of vibration.…”

Section: Introductionmentioning

confidence: 99%

Force modulation for enhanced nanoscale electrical sensing

Koelmans¹,

Sebastian²,

Abelmann³

et al. 2011

Nanotechnology

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Scanning probe microscopy employing conductive probes is a powerful tool for the investigation and modification of electrical properties at the nanoscale. Application areas include semiconductor metrology, probe-based data storage and materials research. Conductive probes can also be used to emulate nanoscale electrical contacts. However, unreliable electrical contact and tip wear have severely hampered the widespread usage of conductive probes for these applications. In this paper we introduce a force modulation technique for enhanced nanoscale electrical sensing using conductive probes. This technique results in lower friction, reduced tip wear and enhanced electrical contact quality. Experimental results using phase-change material stacks and platinum silicide conductive probes clearly demonstrate the efficacy of the proposed technique. Furthermore, conductive-mode imaging experiments on specially prepared platinum/carbon samples are presented to demonstrate the widespread applicability of this technique.

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Force modulation for improved conductive-mode atomic force microscopy

Cited by 3 publications

References 10 publications

Probe-based data storage

Probe-based data storage

Recent advances in high-throughput scanning-probe technology

Force modulation for enhanced nanoscale electrical sensing

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