Force spectrum of a few chains grafted on an AFM tip: Comparison of the experiment to a self-consistent mean field theory simulation

Wang, Tao; Xu, Jiaqin; Qiu, Feng; Zhang, Hongdong; Yang, Yuliang

doi:10.1016/j.polymer.2007.07.066

Cited by 4 publications

(4 citation statements)

References 35 publications

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“…In another related topical field, atomic force microscopy (AFM) is known to be an effective approach for studying localized surface structures and properties, such as viscoelasticity, friction and so on. − Among many applications, local adhesion characteristics could be studied by force spectroscopy method. , The adhesive interaction between the AFM cantilever apex and substrate surface, which could be in resemblance to the capillary interactions, could provide insightful information of the microscopic distribution of surface chemical composition, hydrophobicity, and mechanical properties, etc. It is therefore plausible to explore the feasibility of using force spectroscopy method to study the electrowetting behavior at microscopic scale.…”

Section: Introductionmentioning

confidence: 99%

Nanoscale Electrowetting Effects Studied by Atomic Force Microscopy

Guan

Liu

et al. 2008

J. Phys. Chem. C

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Electric field effect on adhesive characteristics of the polymethyl methacrylate (PMMA) surface is studied by using force spectroscopy method of atomic force microscope (AFM). The adhesive interaction between the AFM tip and dielectric surface is obtained by monitoring the force−distance spectroscopy, which reflects the change of the surface tension under the influence of external electric field. Such changes in adhesion characteristics are attributed to the electrowetting effect at relatively low electrical field strength and the electrowetting saturation effect at high electrical field strength. It is also suggested that the force spectroscopy method has noticeably high stability in studying adhesion characteristics at nanometer scale.

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Section: Introductionmentioning

confidence: 99%

Nanoscale Electrowetting Effects Studied by Atomic Force Microscopy

Guan

Liu

et al. 2008

J. Phys. Chem. C

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“…The apparent thickness of the thin film is approximately 13 nm, which is compatible with a dense self-assembled monolayer (SAM) of the MeOPEGMA oligomer that has a contour length of about 16 nm [35]. We note that we have imaged in ambient conditions; due to the humidity in the environment and to the fact that both mica and PEG have a high affinity for water, there is the opportunity for the PEG SAM to be swollen [12].…”

Section: Discussionmentioning

confidence: 61%

Nanostructures and Thin Films of Poly(Ethylene Glycol)-Based Surfactants and Polystyrene Nanocolloid Particles on Mica: An Atomic Force Microscopy Study

2023

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We studied the nanostructures and ultrathin films resulting from the deposition and adsorption of polystyrene nanocolloidal particles and methoxy poly(ethylene glycol) methacrylate surfactants on mica surfaces from mixed suspensions in water. The samples were prepared by droplet evaporation and dip coating and imaged with atomic force microscopy. Topography and phase imaging revealed a significant richness in morphological features of the deposited/adsorbed films. We observed uniform ultrathin films and extended islands of the surfactant oligomers indicating their self-assembly in monolayers and multilayers, while the polystyrene nanocolloids were embedded within the surfactant structures. Droplet evaporation resulted in the migration of particles towards the edges of the droplet leaving an intricate network of imprints within the surfactant film. Dip coating induced the formation of extended nanocolloid clusters with colloidal crystalline structuring.

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“…Studies have shown that the location of functional groups in relation to the position of the approaching particle or contaminant has a signicant effect on the particle-surface interactions. 6,7,9,10,37 Functional groups located directly between the particle and surface endure a strong compression upon approach which in turn induces an opposing repulsive force and renders the surface contamination resistant. 10 However, an increase in dispersive interactions may be evident if functional groups are positioned away from the particle i.e.…”

Section: Surface Classicationmentioning

confidence: 99%