2019
DOI: 10.1016/j.procs.2019.09.357
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Formal Verification approaches of Self-adaptive Systems: A Survey

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Cited by 11 publications
(3 citation statements)
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“…The rapid growth in the degree of integration of technological components of DIS often does not give an idea of their internal structure, being limited to the functional and information specifications of certain presentation levels [24]. As a result, both the design of DIS and testing in its composition, with rare exceptions, for example, FPGA [25,26], are significantly shifted from logical-electrical to architectural, systemfunctional levels [27,28] and use complex technologies [29,30] based on models and calculi of different classes.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…The rapid growth in the degree of integration of technological components of DIS often does not give an idea of their internal structure, being limited to the functional and information specifications of certain presentation levels [24]. As a result, both the design of DIS and testing in its composition, with rare exceptions, for example, FPGA [25,26], are significantly shifted from logical-electrical to architectural, systemfunctional levels [27,28] and use complex technologies [29,30] based on models and calculi of different classes.…”
Section: Introductionmentioning
confidence: 99%
“…As noted, for real large systems, complex design and testing technologies are the most effective [29,30], various interrelated methods of which take into account as much as possible all the information available in the input specifications about the architecture, technologies, operation, information structures of DIS and their components. In this case, it becomes possible to use information about the calculated and empirical energy characteristics of the DIS components in the most complete, diverse, in statics and dynamics.…”
Section: Introductionmentioning
confidence: 99%
“…The rapid growth in the degree of integration of technological components of DIS often does not give an idea of their internal structure, being limited to the functional and information specifications of certain presentation levels [24]. As a result, both the design of DIS and testing in its composition, with rare exceptions, for example, FPGA [25,26], are significantly shifted from logical-electrical to architectural, systemfunctional levels [27,28] and use complex technologies [29,30] based on models and calculi of different classes.…”
Section: Introductionmentioning
confidence: 99%