2013
DOI: 10.1149/2.066310jes
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Formation and Crystallization of Anodic Oxide Films on Sputter-Deposited Titanium in Potentiostatic and Potential-Sweep Modes

Abstract: Sputter-deposited titanium substrates were anodically treated in sulfuric acid solution both in potentiostatic and potential-sweep modes. The morphology, crystallization, chemical compositions and electrochemical properties of anodic titanium oxide films were detected by AFM, SE, Raman spectra, XPS and EIS. The formed anodic films are smooth and homogeneously crystallized, and that the potentiostatically grown film is slightly thicker and less crystalline than the potentiodynamically formed film. Moreover, a c… Show more

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Cited by 8 publications
(3 citation statements)
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“…The pits observed on the surface of 316L SS sample are larger and present deeper holes in comparison to all Ti–Cu samples. Figure a shows that the pure Ti‐coated 316L SS has a greater corrosion resistance than uncoated SS, which is ascribed to a dense titanium oxide passive layer formed on the surface of the Ti film …”
Section: Resultsmentioning
confidence: 99%
“…The pits observed on the surface of 316L SS sample are larger and present deeper holes in comparison to all Ti–Cu samples. Figure a shows that the pure Ti‐coated 316L SS has a greater corrosion resistance than uncoated SS, which is ascribed to a dense titanium oxide passive layer formed on the surface of the Ti film …”
Section: Resultsmentioning
confidence: 99%
“…The unannealed sample prepared at 80 V is amorphous, while the samples formed at various potentials and were subsequently annealed at 450 C for 2 h present the anatase phases. Fig.2breveals the double peaks at 458.6 and 464.3 eV, corresponding to the Ti 2p 3/2 and Ti 2p 1/2 of the Ti 4+ (TiO 2 ), respectively 24. The O 1s XPS peak of the formed TiO 2 NTs in Fig.2ccan be separated with two distinct peaks, the dominant peak at 529.7 eV is in agreement with O 1s electron binding energy for TiO 2 , whereas the weak peak at 531.3 eV suggests the formation of F-Ti-O or N-Ti-O structures 25.…”
mentioning
confidence: 96%
“…28−30 The O 1s XPS spectrum can be resolved into three peaks, which are attributed to Ti−O bond, Ti−OH bond, and water or carbon impurity, respectively (Figure 4b). 29,31,32 This implies that the BF 4 −TiO 2 NTs contain a small amount of titanium hydroxides on their surface. The F 1s spectrum contains two peaks, the peak at about 684.21 eV represents the Ti−F bond, whereas the peak at 688.89 eV implies that the F element is partly doped into the TiO 2 lattice (Figure 4c).…”
mentioning
confidence: 99%