2011
DOI: 10.1016/j.jallcom.2010.12.021
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Formation mechanisms of ZnO nanocrystals embedded in an amorphous Zn2xSi1−xO2 layer due to sputtering and annealing

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Cited by 3 publications
(3 citation statements)
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“…We see that the average sizes and the standard deviations decrease with increasing temperature. The decrease of the average sizes of ZnO-NCs with increasing annealing temperature is presumably because of the formation of Zn 2 SiO 4 at the ZnO and SiO 2 interfaces [6]. The reduction of the corresponding standard deviation indicates that the average sizes become more uniform with increasing temperature.…”
Section: Resultsmentioning
confidence: 99%
“…We see that the average sizes and the standard deviations decrease with increasing temperature. The decrease of the average sizes of ZnO-NCs with increasing annealing temperature is presumably because of the formation of Zn 2 SiO 4 at the ZnO and SiO 2 interfaces [6]. The reduction of the corresponding standard deviation indicates that the average sizes become more uniform with increasing temperature.…”
Section: Resultsmentioning
confidence: 99%
“…By the same token, when the annealing temperature increases, the bandwidth of the broad emission from ZnO-nc decreases thus resulting in decreasing the spectral overlap between the ZnO-nc broadband emission and the Eu 3+ ion excitation, and therefore a reduction in energy transfer from the ZnO-nc to the Eu 3+ ions leading to a reduction in the red emission intensity from the Eu 3+ ions. In addition, the energy transfer from ZnO-nc to the Eu 3+ ions is inhibited in the samples annealed at 550 o C and 600 o C due to the possible formation of Zn 2 SiO 4 at the surface of the ZnO-nc [159]. Formation of Zn 2 SiO 4 reduces the size of ZnO-nc causing reduction of PL emission [159] from the ZnO-nc and also results in increase in distance between ZnO-nc and Eu 3+ ion which results in reduces energy transfer from the ZnO-nc to the Eu 3+ ions.…”
Section: To Obtain the Optimum Red Emission Intensity From The Eu 3+mentioning
confidence: 99%
“…In addition, the energy transfer from ZnO-nc to the Eu 3+ ions is inhibited in the samples annealed at 550 o C and 600 o C due to the possible formation of Zn 2 SiO 4 at the surface of the ZnO-nc [159]. Formation of Zn 2 SiO 4 reduces the size of ZnO-nc causing reduction of PL emission [159] from the ZnO-nc and also results in increase in distance between ZnO-nc and Eu 3+ ion which results in reduces energy transfer from the ZnO-nc to the Eu 3+ ions. In this work, the optimum RTP annealing temperature has been found to be 450 o C.…”
Section: To Obtain the Optimum Red Emission Intensity From The Eu 3+mentioning
confidence: 99%