2010
DOI: 10.1007/s10853-010-5198-5
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Formation of In nanoparticles on InP wafers by laser-assisted etching

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Cited by 2 publications
(4 citation statements)
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“…The average NPs (diameter) was obtained from the TEM images of the InP samples after the exposure to the electron beam and fs laser irradiation, the corresponding values are presented and compared with previous data reported in the literature in the Table 2 . An analysis of the results renders that the In NPs obtained by electron beam have a small size (5–25 nm) with respect to samples irradiated with fs laser beam (5–200 nm), and these values are in the range of the previous values obtained by Golberg et al and Musaev et al…”
Section: Qtaim Results Of the Charge Density ρBcp At The (3 −1) Bosupporting
confidence: 56%
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“…The average NPs (diameter) was obtained from the TEM images of the InP samples after the exposure to the electron beam and fs laser irradiation, the corresponding values are presented and compared with previous data reported in the literature in the Table 2 . An analysis of the results renders that the In NPs obtained by electron beam have a small size (5–25 nm) with respect to samples irradiated with fs laser beam (5–200 nm), and these values are in the range of the previous values obtained by Golberg et al and Musaev et al…”
Section: Qtaim Results Of the Charge Density ρBcp At The (3 −1) Bosupporting
confidence: 56%
“…Initially, in Figure D, the indexation of the crystallographic planes of the matrix—(111), (200), (220), and (311)—confirms the presence of cubic InP (crystallographic card JCPDS (No. 32‐452), space group F4¯3m) . In NPs are formed on the surface of the InP sample with the progress of time; after 4 min of exposure to the beam (Figure E), both the amount and size of In NPs increase (Figure F).…”
Section: Qtaim Results Of the Charge Density ρBcp At The (3 −1) Bomentioning
confidence: 99%
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