1996
DOI: 10.1016/0040-6090(95)08066-x
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Formation of porous silicon on patterned substrates

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Cited by 45 publications
(21 citation statements)
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“…A thin 5i02 film was deposited between the substrate and the 300nm silicon nitride to avoid cracks and stresses within the Si3N4 layer and the silicon areas to be anodized. In order to prevent that LPCVD Si3N4 be dissolved before the end of the anodization process in the HF/ethanol electrolyte, the samples were heated in an RTA oven at 1080 °C for 10 minutes, using N2 as inert gas [10]. This additional step resulted in a strong decrease of the Si3N4 etch rate as compared with other samples, where this annealing was not applied.…”
Section: Methodsmentioning
confidence: 99%
“…A thin 5i02 film was deposited between the substrate and the 300nm silicon nitride to avoid cracks and stresses within the Si3N4 layer and the silicon areas to be anodized. In order to prevent that LPCVD Si3N4 be dissolved before the end of the anodization process in the HF/ethanol electrolyte, the samples were heated in an RTA oven at 1080 °C for 10 minutes, using N2 as inert gas [10]. This additional step resulted in a strong decrease of the Si3N4 etch rate as compared with other samples, where this annealing was not applied.…”
Section: Methodsmentioning
confidence: 99%
“…Si dioxide can be used for short anodization times [32,35]. Stoichiometric silicon nitride and silicon carbide induces stress problems leading to cracking [32,36]. However, nonstoichiometric silicon nitride is a good masking material.…”
Section: Effect Of Anodization Conditionsmentioning
confidence: 99%
“…The usual choice for masking is the deposition of thin films, such as polysilicon over silicon dioxide [10] and silicon nitride [9] or carbonitride (SiCN) [11]. Additionally, the current blocking can be obtained through n-type doping (such as phosphorous) by ion implantation into p-type silicon substrates [12].…”
Section: Introductionmentioning
confidence: 99%