2010
DOI: 10.1007/s00339-010-5848-0
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Formation of Schottky-type metal/SrTiO3 junctions and their resistive properties

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Cited by 27 publications
(13 citation statements)
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“…Particularly, forming reliable, low‐resistance ohmic contacts are of critical importance to the advancement of oxide electronics. Majority of metals form Schottky barriers when deposited on oxide surfaces . Among functional oxides, Ti‐based oxides including titanium dioxide (TiO 2 ) and strontium titanium oxide (SrTiO 3 /STO) are widely investigated.…”
Section: Introductionmentioning
confidence: 99%
“…Particularly, forming reliable, low‐resistance ohmic contacts are of critical importance to the advancement of oxide electronics. Majority of metals form Schottky barriers when deposited on oxide surfaces . Among functional oxides, Ti‐based oxides including titanium dioxide (TiO 2 ) and strontium titanium oxide (SrTiO 3 /STO) are widely investigated.…”
Section: Introductionmentioning
confidence: 99%
“…The ability to form reliable, low‐resistance Ohmic contacts is of critical importance to the ongoing development of oxide electronics. The vast majority of metals form Schottky barriers when deposited on oxide surfaces 1–3. Ohmic contacts rarely occur, and little is known at an atomistic level about what leads to a good Ohmic contact on a wide‐gap oxide.…”
mentioning
confidence: 99%
“…Previous transport investigations have shown that Au, Ag, Cu, and Pt form Schottky barriers on STO, whereas Al forms an Ohmic contact. [7][8][9][10][11] It is also known that redox chemistry occurs at the Al/STO(001) interface at room temperature. 6 One common denominator in these previous studies is that structurally coherent bonding between the terminal atomic layer in the STO and the initial metal layer does not occur at the interface due to lattice mismatch.…”
mentioning
confidence: 99%