2012 IEEE 14th Electronics Packaging Technology Conference (EPTC) 2012
DOI: 10.1109/eptc.2012.6507153
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Formation of solder cap on Cu pillar bump using formic acid reduction

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Cited by 7 publications
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“…On the basis of the previous studies [2][3][4][5][6] , the method of using formic acid atmosphere is believed to be a promising technique for fluxless soldering. The oxide films of conventional Sn-3.0Ag-0.5Cu are mostly composed of SnO and SnO 2 7)…”
Section: Introductionmentioning
confidence: 99%
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“…On the basis of the previous studies [2][3][4][5][6] , the method of using formic acid atmosphere is believed to be a promising technique for fluxless soldering. The oxide films of conventional Sn-3.0Ag-0.5Cu are mostly composed of SnO and SnO 2 7)…”
Section: Introductionmentioning
confidence: 99%
“…Thus, the reaction of formic acid (HCOOH) atmosphere with solder (Sn) oxide can be described as follows 3) :…”
Section: Introductionmentioning
confidence: 99%
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