1986
DOI: 10.1002/pssa.2210980108
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Formation of Texture in Co/Cr Films for Perpendicular Magnetic Recording

Abstract: Texture formation in sputter deposited Co/Cr films is investigated in dependence on film thickness and substrate temperature by means of electron microscopy, electron diffraction, X‐ray diffraction, and magnetic measurements. In films deposited at 350 K film texture forms very rapidly within a transition layer thickness of about 50 nm beginning already in the noncontinuous growth stages below about 10 nm. In films deposited at higher substrate temperatures (up to 550 K) texture formation is much slower combine… Show more

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Cited by 8 publications
(1 citation statement)
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References 28 publications
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“…Previous investigations [6], [9]-[ 121 have demonstrated that CO-Cr films display a columnar microstructure with a strong degree of alignment of the C-axis in the direction perpendicular to the film normal. The high degree of texture in CO-Cr films plays a major role in optimizing their magnetic properties.…”
Section: Introductionmentioning
confidence: 99%
“…Previous investigations [6], [9]-[ 121 have demonstrated that CO-Cr films display a columnar microstructure with a strong degree of alignment of the C-axis in the direction perpendicular to the film normal. The high degree of texture in CO-Cr films plays a major role in optimizing their magnetic properties.…”
Section: Introductionmentioning
confidence: 99%