2015
DOI: 10.1115/1.4029183
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Formulation of Influence of Machine Geometric Errors on Five-Axis On-Machine Scanning Measurement by Using a Laser Displacement Sensor

Abstract: For on-machine measurement of workpiece position, orientation, and geometry on machine tools, five-axis continuous (scanning) measurement by using a laser displacement sensor has a strong advantage in its efficiency, compared to conventional discrete measurement using a touch-triggered contact probe. In any on-machine measurement schemes, major contributors to their measurement uncertainty are error motions of the machine tool itself. This paper formulates the influence of geometric errors of rotary axis avera… Show more

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Cited by 38 publications
(11 citation statements)
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“…In the installation of the measuring rod, it is located in the center of the holes of no more than ±2 mm. For r m < 75 mm, the inclination angle ( θ sen ) caused by the installation of measuring rod is 1.53°, which can meet the angle deviation requirement of LDS [19]. Under the above conditions, the major error of the LDS is its measuring linear error.…”
Section: Major Factors Influencing Measuring Uncertaintymentioning
confidence: 99%
“…In the installation of the measuring rod, it is located in the center of the holes of no more than ±2 mm. For r m < 75 mm, the inclination angle ( θ sen ) caused by the installation of measuring rod is 1.53°, which can meet the angle deviation requirement of LDS [19]. Under the above conditions, the major error of the LDS is its measuring linear error.…”
Section: Major Factors Influencing Measuring Uncertaintymentioning
confidence: 99%
“…Among the investigations of lateral calibrations, many studies focus on the optical system [12]. For example, H. Ni et al proposed a new method to achieve structured detection using a spatial light modulator, which modulates the Airy disk amplitude distribution according to the detection function in the collection arm [13] and B. Wang et al presented confocal microscopy with structured detection in a coherent imaging process to achieve a higher resolution with a comparably large pinhole [14], however, the systematic geometric errors which adversely affect the relative position and orientation between measuring probes and measurands are usually neglected [15,16]. B. Daemi et al designed a comprehensive verification test by using a high precision metrology method based on subpixel resolution image analysis [17].…”
Section: Introductionmentioning
confidence: 99%
“…Simpler and thus lowercost configuration of this sensor is also a crucial advantage in industrial applications. In [14,15], a part of the authors employed the same sensor as the one used in this paper.…”
Section: Introductionmentioning
confidence: 99%