2011
DOI: 10.1117/1.3562319
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Fourier descriptors for defect indication in a multiscale and multisensor measurement system

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Cited by 10 publications
(6 citation statements)
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“…The efficacy of this type of segmentation for the identification and extraction of individual topography features has been documented elsewhere [16]. Many other segmentation techniques are possible, and are the subject of active research [8][9][10][11][12]17]. This work explores texture-based segmentation.…”
Section: Measurement Science and Technologymentioning
confidence: 99%
See 1 more Smart Citation
“…The efficacy of this type of segmentation for the identification and extraction of individual topography features has been documented elsewhere [16]. Many other segmentation techniques are possible, and are the subject of active research [8][9][10][11][12]17]. This work explores texture-based segmentation.…”
Section: Measurement Science and Technologymentioning
confidence: 99%
“…Typical scenarios involve the localisation and verification of structured features, i.e. individual topographic formations explicitly designed and manufactured over the surface [5][6][7][8][9][10][11], and/or the identification and measurement of localised defects and other random singularities [12]. Algorithmic feature identification, an essential element of the characterisation process, is often heavily reliant on areal segmentation, i.e.…”
Section: Introductionmentioning
confidence: 99%
“…Khoje and Bodhe [17] compared classifi cation performance of the Fourier transform based shape descriptors and its derivatives for fruit quality grading of mangoes. Burla et al [18] developed two modifi ed Fourier descriptors methods for fast detection of surface defects on microlens arrays, one kind of micro-optical elements. Zheng et al [19] introduced a revised Fourier descriptors based on multiscale centroid contour distance to recognize objects in remote sensing images.…”
Section: Literature Reviewmentioning
confidence: 99%
“…Several researchers have been approaching the characterisation problem as a two-step process: firstly the tiles (or the notable topographic features within the tiles) are identified and extracted as separate geometric entities; then dedicated, custom parameters are devised aimed at capturing properties pertaining to the shape of the tiles, and/or their layout over the surface. Notable examples have been shown for hard disk drives [13], abrasives and optical depixelator surfaces [1] and microlens arrays [5], [16]. The same two-step, tile-centred approach has been adopted by the authors of this paper.…”
Section: Metrological Characterisation Of Tessellated Surfacesmentioning
confidence: 99%
“…on how the tiles are spread over the entire surface. This problem has been extensively investigated in the literature [1], [5], [16], [19] and, at the current state of this research, needs to be implemented as an add-on procedure, for example, by reconstructing the pattern lattice through topological connection of the tile centroids.…”
Section: Layout Information For Tessellated Surfacesmentioning
confidence: 99%