Fractal analysis of electrical trees

Kudo, Kazutoshi

doi:10.1109/94.729694

Cited by 124 publications

(65 citation statements)

References 60 publications

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“…28,29 The built-in FracLac plugin for the ImageJ 30 was used for D f calculations via local-connected-fractal-dimension (LCFD) analysis. This method was tested on a standard Koch snowflake giving a reproducible value of D f = 1.25; the LCFD does not allow evaluation of lacunarity.…”

Section: Methodsmentioning

confidence: 99%

Reversible migration of silver on memorized pathways in Ag-Ge40S60 films

et al. 2015

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Reversible and reproducible formation and dissolution of silver conductive filaments are studied in Ag-photodoped thin-film Ge 40 S 60 subjected to electric fields. A tip-planar geometry is employed, where a conductive-atomic-force microscopy tip is the tip electrode and a silver patch is the planar electrode. We highlight an inherent "memory" effect in the amorphous chalcogenide solid-state electrolyte, in which particular silver-ion migration pathways are preserved "memorized" during writing and erasing cycles. The "memorized" pathways reflect structural changes in the photodoped chalcogenide film. Structural changes due to silver photodoping, and electrically-induced structural changes arising from silver migration, are elucidated using Raman spectroscopy. Conductive filament formation, dissolution, and electron (reduction) efficiency in a lateral device geometry are related to operation of the nano-ionic Programmable Metallization Cell memory and to newly emerging chalcogenide-based lateral geometry MEMS technologies. The methods in this work can also be used for qualitative multi-parameter sampling of metal/amorphous-chalcogenide combinations, characterizing the growth/dissolution rates, retention and endurance of fractal conductive filaments, with the aim of optimizing devices. C 2015 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.

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Section: Methodsmentioning

confidence: 99%

Reversible migration of silver on memorized pathways in Ag-Ge40S60 films

et al. 2015

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“…These include the box counting method, the fractal measure relations, the correlation function, the distribution function and the power spectrum. [7] In this paper, the box counting method is employed to calculate the fractal dimension. Since the box counting method plays an essential role analyzing the tracking patterns, it is meaningful to explain how the box counting method works before proceeding to discussion of analysis results.…”

Section: Fractal Analysis Of Tracking Patternsmentioning

confidence: 99%

“…In the box counting method [7], a fractal pattern is completely covered by square boxes as shown in Fig. 11, and the following relation is satisfied; ( )~D N r r − where ( ) N r is the total number of covering boxes (r is the length of the box side) and D is the fractal dimension.…”

Section: Fractal Analysis Of Tracking Patternsmentioning

confidence: 99%

“…[4][5] Many researches have been carried out on the fractal characteristics of various dielectric breakdowns. These include, for example, the fractal nature of creeping discharge patterns of solid insulators [4], the fractal dimensions of tracking patterns of gamma irradiated ethylene propylene diene monomer [5], fractals for partial discharge recognition [6], and the fractal analysis of electrical trees [7].…”

Section: Introductionmentioning

confidence: 99%

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Simulation on Surface Tracking Pattern using the Dielectric Breakdown Model

Kim¹,

Roh²

2011

Journal of Electrical Engineering and Technology

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-The tracking pattern formed on the dielectric surface due to a surface electrical discharge exhibits fractal structure. In order to quantitatively investigate the fractal characteristics of the surface tracking pattern, the dielectric breakdown model has been employed to numerically generate the surface tracking pattern. In dielectric breakdown model, the pattern growth is determined stochastically by a probability function depending on the local electric potential difference. For the computation of the electric potential for all points of the lattice, a two-dimensional discrete Laplace equation is solved by mean of the successive over-relaxation method combined to the Gauss-Seidel method. The box counting method has been used to calculate the fractal dimensions of the simulated patterns with various exponent η and breakdown voltage b φ . As a result of the simulation, it is found that the fractal nature of the surface tracking pattern depends strongly on η and b φ .

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“…The investigation related to the above topic is related, among others, to the description of PD characteristics that is related to the electric treeing process [10,11]. Special attention is also paid to forecast the treeing during its propagation [2][3][4]9,12,14]. The studies, mainly of simulation character, were aimed at probable shape and rate of the tree development in the considered insulation system.…”

mentioning

confidence: 99%

Detection of electric treeing of solid dielectrics with the method of acoustic emission

Opydo

Dobrzycki

2011

Electr Eng

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The paper presents results of research of electrical treeing of solid dielectrics with the method of acoustic emission (AE). The study was performed with an alternating voltage of 50 Hz in the range up to 21 kV (RMS) on methyl polymethacrylate or crosslinked polyethylene samples. They were of cuboidal shape of the dimensions 25 × 10 × 4 mm. One of the cuboid sample walls of the dimensions 25×4 mm was covered with a conducting paint. On the opposite wall, a surgical needle of T-25 type was screwed. The distance between the electrodes (the needle and the wall covered with a conducting paint) was in the range 0.5-2.0 mm. Registered signals were denoised with wavelet transformation method and then there were analyzed. The following parameters were analyzed: a sum and rate of acoustic emission counting, a sum and rate of acoustic emission events, RMS value of the electric signal leaving the converter. Spectrum and spectrogram were also analyzed. It was found that AE signals are generated during electrical treeing of solid dielectrics. Values of chosen parameters increased their values when the process begins. There are also some dominant frequencies ranges, different for different kinds of dielectrics, connected with the treeing.

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Fractal analysis of electrical trees

Cited by 124 publications

References 60 publications

Reversible migration of silver on memorized pathways in Ag-Ge40S60 films

Reversible migration of silver on memorized pathways in Ag-Ge40S60 films

Simulation on Surface Tracking Pattern using the Dielectric Breakdown Model

Detection of electric treeing of solid dielectrics with the method of acoustic emission

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