Abstract:The identification of multi-input-multi-output process is always challenging due to significant loop interactions. This article proposes an identification technique for two-input-two-output processes with fractional order models via Haar wavelet feature. The presented technique can estimate independent four fractional single-pole time delay models without additional steps to decouple processes during identification. The method uses a well-known relay feedback test to produce the input-output data for measureme… Show more
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