“…Macro images of failed samples were taken with a digital camera (Nikon D‐70s; Nikon, Tokyo, Japan) and utilized for failure mode classification and comparisons between groups. To identify fractographic markings and characterize failure origin and direction of crack propagation, the most representative failed samples of each group were inspected first under a polarized‐light microscope (MZ‐APO stereomicroscope; Carl Zeiss MicroImaging, Thornwood, NY, USA) and then by scanning electron microscopy (SEM) (Model S‐3500N; Hitachi, Osaka, Japan) (Parrington ; Manda et al. ).…”