Fracture behaviors of thin superconducting films with field-dependent critical current density

Abstract

The fracture behaviors under electromagnetic force with field-dependent critical current density in thin superconducting film are investigated. Applying finite element method, the stress intensity factors of one central crack versus applied field and crack length are obtained for the exponential model, which was compared with the Bean model and Kim model. This work can offer good estimations and provide a basis for interpretation of cracking and mechanical failure of HTS thin films in numerous real situations.

Crack problem for a bulk superconductor with nonsuperconducting inclusions under an electromagnetic force

“…Yong et al 10 firstly studied the crack problem theoretically for a long rectangular slab of superconductor under an electromagnetic force. Thereafter, they made a series of work [11][12][13][14] for various kinds of crack problems in superconductors. Gao et al [15][16][17] investigated the crack growth for superconducing trapped-field magnets and fracture behaviors induced by thermal stress.…”

Fracture behavior of an inclined crack interacting with a circular inclusion in a high-TC superconductor under an electromagnetic force

“…Yong and Zhou 2 studied the crack problem for a long rectangular slab of superconductor under an electromagnetic force firstly. After that, they made a series of investigations [3][4][5][6] for various types of crack problems for superconductors with different shapes. Gao et al [7][8][9] focused on the crack growth of superconducting trapped-field magnets and fracture behaviors induced by thermal stresses.…”