1962
DOI: 10.1080/14786436208212625
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Fracture of oxide films on strained aluminium

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Cited by 49 publications
(16 citation statements)
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“…Al oxide as well as other metallic oxide materials display reduced ductility when compared to their pure metallic counterparts. Oxide layers fracture and lead to failure, as shown for instance in an early work on thin Al films . There must be a critical oxide thickness where there is a transition from this cracking behavior observed at the micron scale to the assisted-ductility behavior observed at the nanoscale.…”
Section: Discussionmentioning
confidence: 97%
See 1 more Smart Citation
“…Al oxide as well as other metallic oxide materials display reduced ductility when compared to their pure metallic counterparts. Oxide layers fracture and lead to failure, as shown for instance in an early work on thin Al films . There must be a critical oxide thickness where there is a transition from this cracking behavior observed at the micron scale to the assisted-ductility behavior observed at the nanoscale.…”
Section: Discussionmentioning
confidence: 97%
“…Oxide layers fracture and lead to failure, 52 as shown for instance in an early work on thin Al films. 53 There must be a critical oxide thickness where there is a transition from this cracking behavior observed at the micron scale to the assisted-ductility behavior observed at the nanoscale. Our oxide layer is amorphous, while macroscopic layers are polycrystalline, and fracture is aided by grain boundaries and crystal plasticity in the oxide.…”
Section: ■ Conclusionmentioning
confidence: 99%
“…In the proposed mechanism, the carrier concentration is essentially independent of temperature, whereas the carrier mobility is a thermally activated process. This conduction mechanism is similar to that proposed for LixNil-xO and other transition metal oxides (2,3) and is often referred to as a "hopping" process. Munakata proposed a "hopping" model for electrical conduction in the vanadate glasses (4).…”
Section: Research and Development Laboratories Corning Glass Work mentioning
confidence: 84%
“…films.--The idealized case of two current transitions discussed previously is well represented by A1203 films, which deform little or not at all during deformation of the substrate aluminum (17,18), because there is a new area with near zero thickness of oxide and a retained old area covered with oxide of the initial thickness. The reanodization method of analysis was applied to cold rolled specimens with either 15 or 100v anodic films.…”
Section: Plastic Deformation Of Nonporous A1203 and Ta205mentioning
confidence: 99%