Fragmentation lifetimes and the internal energy of sputtered clusters

Wucher, A.; Dzhemilev, N. Kh.; Veryovkin, I. V.; Verkhoturov, Stanislav V.

doi:10.1016/s0168-583x(98)00805-2

Cited by 20 publications

(7 citation statements)

References 14 publications

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“…Similar results of approximately size-independent cluster temperatures have been found in other studies 15,16,25,33 ͑simulations and experiments͒, but for cluster sizes n Շ 10. The present results extend the size-independence of cluster temperatures to clusters of sizes n Ӎ 200 for nascent clusters and n Ӎ 60 for final clusters.…”

Section: Temperature Of Nascent and Final Clusterssupporting

confidence: 90%

Fragmentation of clusters sputtered from silver and gold: Molecular dynamics simulations

2005

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Using molecular dynamics simulations and the embedded atom method ͑EAM͒ potential we have investigated the sputtered atom clusters produced by 15 keV xenon impacts on silver and 20 keV xenon impacts on gold. Ejected clusters were simulated for long times, up to 0.01-1 µs, in order to investigate the fragmentation of nascent clusters. The size distributions of nascent and final clusters were calculated and fitted to an inverse power law, resulting in exponents close to 2 and 3, depending on the range of the cluster sizes used. These values are in agreement with other simulations and experiments. The results show that clusters are subject to a dramatic breakup, which makes the size of the largest sputtered cluster go down by a factor of 2-4. Despite this, the exponent in the power law does not change very much from the size distribution of nascent to that of final clusters. Considering the uncertainties, the exponent of the final size distribution is 1.0-1.7 times the exponent of the nascent size distribution.

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Section: Temperature Of Nascent and Final Clusterssupporting

confidence: 90%

Fragmentation of clusters sputtered from silver and gold: Molecular dynamics simulations

2005

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“…50,51 For a sputter source, this kinetic energy typically has two components: one resulting from the sputtering process itself ͑i.e., intrinsic component͒, and the other due to the acceleration of the clusters for mass separation ͑i.e., extrinsic component͒. The intrinsic component depends only weakly on cluster size and is estimated to be about 5 -10 eV/ cluster 37,52 for the sputtering conditions typically used. On a per atom scale, this intrinsic component decreases with increasing cluster size.…”

Section: Cluster Depositionmentioning

confidence: 99%

Ultrahigh vacuum cluster deposition source for spectroscopy with synchrotron radiation

Lau

Achleitner

Ehrke

et al. 2005

Review of Scientific Instruments

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A versatile cluster source has been developed for the deposition and investigation of mass selected metal clusters on single crystal substrates under ultrahigh vacuum conditions. The cluster deposition experiment is designed for spectroscopy with synchrotron radiation to probe the properties of mass selected clusters in x-ray absorption, x-ray magnetic circular dichroism, and x-ray photoelectron spectroscopy. The experimental setup consists of three stages, and is based on a sputter source for cluster production, a magnetic dipole field for mass selection, and an ultrahigh vacuum chamber for cluster deposition. With this cluster source, metal clusters of up to 40 atoms per cluster can be produced, mass separated and deposited onto a substrate. In this size range, cluster current densities of 20pAmm−2–10nAmm−2 have been determined experimentally, depending on cluster material and size. For substrate preparation, the experimental chamber is fully equipped with standard surface science tools. Cluster yields are presented for a variety of sputter targets. The capability to produce truly size-selected clusters is demonstrated with mass spectra.

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“…Acceleration and retardation voltages were set to decelerate the cluster ions to less than 1-2 eV per atom. Since the energy distribution of clusters produced in a sputter source [42,43] is centered about 5-10 eV, with a width of approx. 5-10 eV, the potential applied to the sample was set to 11 V higher than the acceleration voltage.…”

Section: X-ray Absorption Experiments On Soft Landed Metal Clustersmentioning

confidence: 99%

Soft landing of size-selected clusters in rare gas matrices

Lau

Würth

Ehrke

et al. 2003

Low Temperature Physics

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Soft landing of mass selected clusters in rare gas matrices is a technique used to preserve mass selection in cluster deposition. To prevent fragmentation upon deposition, the substrate is covered with rare gas matrices to dissipate the cluster kinetic energy upon impact. Theoretical and experimental studies demonstrate the power of this technique. Besides STM, optical absorption, excitation, and fluorescence experiments, x-ray absorption at core levels can be used as a tool to study soft landing conditions, as will be shown here. X-ray absorption spectroscopy is also well suited to follow diffusion and agglomeration of clusters on surfaces via energy shifts in core level absorption.

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Fragmentation lifetimes and the internal energy of sputtered clusters

Cited by 20 publications

References 14 publications

Fragmentation of clusters sputtered from silver and gold: Molecular dynamics simulations

Fragmentation of clusters sputtered from silver and gold: Molecular dynamics simulations

Ultrahigh vacuum cluster deposition source for spectroscopy with synchrotron radiation

Soft landing of size-selected clusters in rare gas matrices

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