2008
DOI: 10.3103/s1062873808070095
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Fragmentation of sputtered Si n O m + clusters: Release kinetic and dissociation energies

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Cited by 14 publications
(9 citation statements)
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“…Significantly, our computed binding energy for SiO loss is much higher and probably more reliable than those values inferred in a rather indirect analysis of experimental kinetic energy release data ( D 0 = 0.75 and 1.06 eV). 44…”
Section: Resultsmentioning
confidence: 99%
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“…Significantly, our computed binding energy for SiO loss is much higher and probably more reliable than those values inferred in a rather indirect analysis of experimental kinetic energy release data ( D 0 = 0.75 and 1.06 eV). 44…”
Section: Resultsmentioning
confidence: 99%
“…42,43 In addition, the dissociation into Si 2 O + and SiO was predicted to be the lowest-energy fragment channel. 42 The analysis of the kinetic energy release upon metastable decay of Si 3 O 2 + into SiO using the Klots evaporation ensemble and Rice-Ramsperger-Kassel (RRK) models yielded dissociation energies of 0.75 and 1.06 eV, respectively, 44 much lower than those calculated for a variety of Si n O m + ions including Si 3 O 2 + (2–4 eV). 42…”
Section: Introductionmentioning
confidence: 99%
“…The emissions and fragmentation of sputtered were investigated in an inverse geometry double focusing secondary ion mass spectrometer [3] using the procedure described in [4][5][6][7]. clusters were generated by bombarding V targets with Xe + ions at an angle of 45° while the surface was scanned over a 1.5 × 1.5 mm field and O 2 was bled into the chamber up to pressures of 4-5 × 10 -3 Pa.…”
Section: Methodsmentioning
confidence: 99%
“…A spread of excitation energies δN/δE B = f(E B ) [8,9] was observed in the sputtered clusters, which were found to decay along the route from target to detector [3][4][5][6][7]. Fragmentation study relies on the availability of zones in the experimental setup [3] in which direct registration of secondary ion decay is possible in various time spans.…”
Section: Methodsmentioning
confidence: 99%
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