2020
DOI: 10.1103/physrevapplied.14.054026
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Frequency Fluctuations in Tunable and Nonlinear Microwave Cavities

Abstract: We present a model for measurements of the scattering matrix elements of tunable microwave cavities in the presence of resonant frequency fluctuations induced by fluctuations in the tuning parameter. We apply this model to the specific case of a two-sided cavity and find an analytic expression for the average scattering matrix elements. A key signature of this 'fluctuating model' is a subtle deformation of the trajectories swept out by scattering matrix elements in the complex plane. We apply this model to exp… Show more

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Cited by 10 publications
(3 citation statements)
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“…The cCPT sample used for the following measurements exhibits a total tunability of about 140 MHz, centered about the bare cavity frequency at 5.757 GHz. Following a model that accounts for frequency fluctuations in the cavity [42], the typical external and internal damping rates observed at (n g , Φ ext ) = (0, 0) are ∼0.97 MHz and ∼0.3 MHz, respectively. We therefore fix the modulation frequency ω m to be 30 MHz, one order of magnitude higher than the total damping rate.…”
Section: A Circuitrymentioning
confidence: 99%
See 1 more Smart Citation
“…The cCPT sample used for the following measurements exhibits a total tunability of about 140 MHz, centered about the bare cavity frequency at 5.757 GHz. Following a model that accounts for frequency fluctuations in the cavity [42], the typical external and internal damping rates observed at (n g , Φ ext ) = (0, 0) are ∼0.97 MHz and ∼0.3 MHz, respectively. We therefore fix the modulation frequency ω m to be 30 MHz, one order of magnitude higher than the total damping rate.…”
Section: A Circuitrymentioning
confidence: 99%
“…Notice that r n (t) takes the general form of a reflectioncoefficient at ω c + nω m , but is slowly time-varying due to the low-frequency fluctuations in cavity resonance itself. Typical measurements of cavity reflection coefficients using a vector network analyzer outputs the value averaged over the measurement time, and often smears out the effects of these resonant fluctuations [42,43].…”
Section: Introductionmentioning
confidence: 99%
“…We attribute this discrepancy to two factors. First and foremost, the resonant frequency fluctuates due to 1/f charge and flux noise [30,38] over the course of each measurement, which means our carrier is not always on resonance. On average, this reduces the output sideband power yielding worse charge sensitivity than expected.…”
mentioning
confidence: 99%