Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node

Xiong, Y.; Feeley, A.; Massengill, L.W.; Bhuva, B. L.; Wen, S.-J.; Fung, Rita

doi:10.1109/irps46558.2021.9405128

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Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node

Cited by 5 publications

References 10 publications

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