2017
DOI: 10.1109/tpwrs.2016.2608927
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From Available Synchrophasor Data to Short-Circuit Fault Identity: Formulation and Feasibility Analysis

Abstract: https://eprints.whiterose.ac.uk/ Sadegh Azizi (S'12) received the B.Sc., M.Sc. and Ph.D. degrees all in electrical engineering from K. N.

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Cited by 22 publications
(61 citation statements)
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“…On the other hand, the LoG identification can be easily limited to the disturbed area if the boundaries of that area are observed by PMUs. The same approach has been already introduced and successfully tested by the authors in [21].…”
Section: A General Evaluation Of the Proposed Methodsmentioning
confidence: 99%
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“…On the other hand, the LoG identification can be easily limited to the disturbed area if the boundaries of that area are observed by PMUs. The same approach has been already introduced and successfully tested by the authors in [21].…”
Section: A General Evaluation Of the Proposed Methodsmentioning
confidence: 99%
“…Other generators in the system are each modeled by a sub-transient reactance in series with a constant voltage source. The values of these voltage sources are not needed for our calculations as they do not appear in the superimposed circuit [21]. The Thevenin-Norton equivalent theorem is used to transform this model into a constant current source in parallel with the corresponding reactance [22].…”
Section: A Linear Systems Of Equations Associated With Log Eventsmentioning
confidence: 99%
“…These methods are classified into two groups: Traveling wave based [24][25][26][27][28] and impedance based. [29][30][31][32][33][34][35][36][37][38][39] Traveling wave based methods require high sampling rates for measurements whereas impedance-based methods need much lower rates. 38 A comparison between traditional and wide area fault location methods can be found in Table 1.…”
Section: In This Condition Accuratementioning
confidence: 99%
“…Wide area fault location methods propose solution that finds the location of the fault with restricted number of measurements that are not obtained from the faulted line directly. These methods are classified into two groups: Traveling wave based 24‐28 and impedance based 29‐39 . Traveling wave based methods require high sampling rates for measurements whereas impedance‐based methods need much lower rates 38 .…”
Section: Introductionmentioning
confidence: 99%
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