From Embedded Test to Embedded Diagnosis

Wunderlich, Hans-Joachim

doi:10.1109/ets.2005.26

Cited by 10 publications

(1 citation statement)

References 66 publications

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“…However, there is a large overlap in between dealing with yield ramping and design for manufacturability [10], [11], [12]. Diagnosis and debug have the common objective of achieving high diagnostic resolution and especially fault model independent approaches are suitable for both of these tasks.…”

Section: A Debug and Diagnosismentioning

confidence: 98%

Adaptive Debug and Diagnosis without Fault Dictionaries

Holst¹,

Wunderlich²

2008

2008 13th European Test Symposium

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Diagnosis is essential in modern chip production to increase yield, and debug constitutes a major part in the presilicon development process. For recent process technologies, defect mechanisms are increasingly complex, and continuous efforts are made to model these defects by using sophisticated fault models. Traditional static approaches for debug and diagnosis with a simplified fault model are more and more limited.In this paper, a method is presented, which identifies possible faulty regions in a combinational circuit, based on its input/output behavior and independent of a fault model. The new adaptive, statistical approach combines a flexible and powerful effect-cause pattern analysis algorithm with highresolution ATPG. We show the effectiveness of the approach through experiments with benchmark and industrial circuits.

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Section: A Debug and Diagnosismentioning

confidence: 98%