Full Information Acquisition in Scanning Probe Microscopy

Jesse, Stephen; Somnath, Suhas; Collins, Liam; Kalinin, Sergei V.

doi:10.1017/s1551929517000633

Cited by 3 publications

(5 citation statements)

References 87 publications

(101 reference statements)

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“…In this way, G-Mode trades large data sizes for complete information capture in the time domain. 73,74 The next step in F 3 R consists of preprocessing the data in preparation for force recovery. The goal of this step is to remove unwanted noise from the stored photodetector signal without any significant information loss of the real-time cantilever displacement.…”

Section: Resultsmentioning

confidence: 99%

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Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform

Collins¹,

Ahmadi

et al. 2017

ACS Nano

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Atomic force microscopy (AFM) offers unparalleled insight into structure and material functionality across nanometer length scales. However, the spatial resolution afforded by the AFM tip is counterpoised by slow detection speeds compared to other common microscopy techniques (e.g., optical, scanning electron microscopy, etc.). In this work, we develop an ultrafast AFM imaging approach allowing direct reconstruction of the tip-sample forces with ∼3 order of magnitude higher time resolution than is achievable using standard AFM detection methods. Fast free force recovery (FR) overcomes the widely viewed temporal bottleneck in AFM, that is, the mechanical bandwidth of the cantilever, enabling time-resolved imaging at sub-bandwidth speeds. We demonstrate quantitative recovery of electrostatic forces with ∼10 μs temporal resolution, free from influences of the cantilever ring-down. We further apply the FR method to Kelvin probe force microscopy (KPFM) measurements. FR-KPFM is an open loop imaging approach (i.e., no bias feedback), allowing ultrafast surface potential measurements (e.g., <20 μs) to be performed at regular KPFM scan speeds. FR-KPFM is demonstrated for exploration of ion migration in organometallic halide perovskite materials and shown to allow spatiotemporal imaging of positively charged ion migration under applied electric field, as well as subsequent formation of accumulated charges at the perovskite/electrode interface. In this work, we demonstrate quantitative FR-KPFM measurements-however, we fully expect the FR approach to be valid for all modes of noncontact AFM operation, including noninvasive probing of ultrafast electrical and magnetic dynamics.

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Section: Resultsmentioning

confidence: 99%

“…∼0.5 Hz), where a typical 256 × 256 position data set, with each position corresponding to ∼4 ms of real-time data acquisition sampled at 4 MHz, leading to an overall file size of ∼4 Gb. In this way, G-Mode trades large data sizes for complete information capture in the time domain. , …”

Section: Resultsmentioning

confidence: 99%

Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform

Collins¹,

Ahmadi

et al. 2017

ACS Nano

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“…Two recent reviews summarizing the history of SPM and its challenges, as well as information acquisition from SPM, can be found elsewhere. 57,58 Atomic Force Microscopy With a probe tip continuously touching the sample surface, AFM provides a 3D topographic image. Compared with other microscopy techniques mentioned above, in situ AFM has fewer requirements for sample preparation and pretreatments.…”

Section: Scanning Probe Microscopymentioning

confidence: 99%

Visualizing Battery Reactions and Processes by Using In Situ and In Operando Microscopies

Liu

2018

Chem

127

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Based on traditional electronic, X-ray, and optical microscopies, novel tools and methodologies have been developed to monitor batteries in situ or in operando. This review surveys the recent development of several types of in situ and in operando microscopy and their utilization in studying batteries. The article is organized mainly by the in situ and in operando techniques used (X-ray microscopy, electron microscopy, scanning probe microscopy, etc.) rather than the chemical reactions that govern battery behavior. We compare different methodologies to illustrate their advantages and disadvantages in the study of different systems and problems and, at the end of the article, discuss generalized principles for the selection of methodologies and possible future directions.

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“…Since then, an increasing number of multifrequency SPM techniques including, amongst many others, bi-/tri-modal SPM 32 , 33 and intermodulation techniques 34 , 35 as well as multidimensional approaches such as three-dimensional force mapping AFM 36 – 38 (3D-AFM), holography 39 , and time-resolved 40 – 42 techniques have been realized. Finally, the general acquisition (G)-Mode 43 – 45 approach has recently been developed to enable full capture of the information stream from the photodetector, potentially reaching the information limit of SPM.…”

Section: Introductionmentioning

confidence: 99%

“…However, multifrequency/multidimensional techniques such as intermodulation SPM 34 , 35 , BE 27 – 31 , and G-Mode 43 – 45 generate large, often complex, datasets, necessitating approaches for visualizing and converting the data to materials specific information. In prior BE work, we have primarily used functional fitting of the data in the Fourier domain 27 – 31 , relying on a prior based on simple harmonic oscillator physics (SHO model) of the tip–surface interactions.…”

Section: Introductionmentioning

confidence: 99%

High-veracity functional imaging in scanning probe microscopy via Graph-Bootstrapping

Collins

Miyazawa

et al. 2018

Nat Commun

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The key objective of scanning probe microscopy (SPM) techniques is the optimal representation of the nanoscale surface structure and functionality inferred from the dynamics of the cantilever. This is particularly pertinent today, as the SPM community has seen a rapidly growing trend towards simultaneous capture of multiple imaging channels and complex modes of operation involving high-dimensional information-rich datasets, bringing forward the challenges of visualization and analysis, particularly for cases where the underlying dynamic model is poorly understood. To meet this challenge, we present a data-driven approach, Graph-Bootstrapping, based on low-dimensional manifold learning of the full SPM spectra and demonstrate its successes for high-veracity mechanical mapping on a mixed polymer thin film and resolving irregular hydration structure of calcite at atomic resolution. Using the proposed methodology, we can efficiently reveal and hierarchically represent salient material features with rich local details, further enabling denoising, classification, and high-resolution functional imaging.

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Full Information Acquisition in Scanning Probe Microscopy

Cited by 3 publications

References 87 publications

Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform

Breaking the Time Barrier in Kelvin Probe Force Microscopy: Fast Free Force Reconstruction Using the G-Mode Platform

Visualizing Battery Reactions and Processes by Using In Situ and In Operando Microscopies

High-veracity functional imaging in scanning probe microscopy via Graph-Bootstrapping

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