Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials 2017
DOI: 10.7567/ssdm.2017.g-6-03
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Fully Digital Ternary Content Addressable Memory using Ratio-less SRAM Cells and Hierarchical-AND Matching Comparator for Ultra-low-voltage Operation

Abstract: A 36-bit x 32-entry fully digital ternaly content addressable memory (TCAM) using the Ratio-less 12transistor SRAM (RL-12T-SRAM) technology and fully complementary hierarchical-AND matching comparators (HAMCs) was developed for ultra-low-voltage operation. The minimum operating supply voltage of 0.25V which is the less than half of the conventional TCAM was experimentally confirmed by the developed test chip.

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“…Since the 6-transistor SRAM cells and the MLSA in the conventional TCAM suffer from device variabilities especially in the lowsupply voltage range, we have developed the ratioless TCAM cell and a fully complementary hierarchical-AND matching comparator (HAMC). 29,30) We have developed a test chip including the proposed TCAM and conventional TCAM and confirmed the operation of the power supply voltage of 0.25 V. 31) In addition to the design of RL-TCAM, we also disclose the technique of measuring the TCAM function with a digital LSI tester in such an ultra low-voltage region in this paper.…”
Section: Introductionmentioning
confidence: 79%
“…Since the 6-transistor SRAM cells and the MLSA in the conventional TCAM suffer from device variabilities especially in the lowsupply voltage range, we have developed the ratioless TCAM cell and a fully complementary hierarchical-AND matching comparator (HAMC). 29,30) We have developed a test chip including the proposed TCAM and conventional TCAM and confirmed the operation of the power supply voltage of 0.25 V. 31) In addition to the design of RL-TCAM, we also disclose the technique of measuring the TCAM function with a digital LSI tester in such an ultra low-voltage region in this paper.…”
Section: Introductionmentioning
confidence: 79%