Fully Time-Domain Scanning of Em Near-Field Radiated by Rf Circuits

Liu, Yang; Ravelo, Blaise

doi:10.2528/pierb13072903

Cited by 25 publications

(24 citation statements)

References 47 publications

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“…Addressing the issue of finding where a chip leaks the most EM radiation has been investigated in [15], and [16]. EM scanning with a focus on side-channel attacks, that is, determining where the most cryptographic information leaks within a chip has been addressed in [17], [18], and [19].…”

Section: Background and Related Workmentioning

confidence: 99%

SCNIFFER: Low-Cost, Automated, Efficient Electromagnetic Side-Channel Sniffing

et al. 2020

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Electromagnetic (EM) side-channel analysis (SCA) is a prominent tool to break mathematically-secure cryptographic engines, especially on resource-constrained devices. Presently, to perform EM SCA on an embedded device, the entire chip is manually scanned and the MTD (Minimum Traces to Disclosure) analysis is performed at each point on the chip to reveal the secret key of the encryption algorithm. However, an automated end-to-end framework for EM leakage localization, trace acquisition, and the attack has been missing. This work proposes SCNIFFER: a low-cost, automated EM Side-Channel leakage SNIFFing platform to perform efficient end-to-end Side-Channel attacks. Using a leakage measure such as Test Vector Leakage Assessment (TVLA), or the signal to noise ratio (SNR), we propose a greedy gradient-search heuristic that converges to one of the points of highest EM leakage on the chip (dimension: N × N) within O(N) iterations, and then perform Correlational EM Analysis (CEMA) at that point. This reduces the CEMA attack time by ∼ N times compared to an exhaustive MTD analysis, and by > 20× compared to choosing an attack location at random. We demonstrate SCNIFFER using a low-cost custombuilt 3-D scanner with an H-field probe (< $500) compared to > $50, 000 commercial EM scanners, and a variety of microcontrollers as the devices under attack. The SCNIFFER framework is evaluated for several cryptographic algorithms (AES-128, DES, RSA) running on both an 8-bit Atmega microcontroller and a 32-bit ARM microcontroller to find a point of high leakage and then perform a CEMA at that point.

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Section: Background and Related Workmentioning

confidence: 99%

SCNIFFER: Low-Cost, Automated, Efficient Electromagnetic Side-Channel Sniffing

et al. 2020

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“…In order to evaluate EM radiation in the near field region, modeling methods based on inverse problem resolution have been widely presented in the literature [3], [5][6][7][8][9][10][11]. Indeed, EMC NF measurements for inverse problems are performed in the reactive region and are generally interested in the identification of real or equivalent radiating sources in the studied structure [3], [5][6][7][8][9][10][11][12][13][14].…”

Section: Introductionmentioning

confidence: 99%

“…In certain cases of transient emissions, analyses only in the FD are insufficient [10][11]. Hence, to overcome this issue, researchers have recently moved towards the investigation of EM inverse methods in the TD [10][11][12][13][14][15][16].…”

Section: Introductionmentioning

confidence: 99%

“…In [11], a GA-based method has been developed in TD, but it is sensible to selected GA options. In [12][13][14], authors have demonstrated the efficiency of TD methods to deal with EM transients that are emitted by a micro strip device. Nevertheless, in these approaches the main drawback has been the limitation in terms of time and space resolutions, which mainly depends on the frequency range and on the use of powerful calculating machines [12].…”

Section: Introductionmentioning

confidence: 99%

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Electromagnetic Time Reversal in the Near Field: Characterization of Transient Disturbances in Power Electronics

Hedia

Zitouna

Slama

et al. 2020

IEEE Trans. Electromagn. Compat.

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In the present paper, the electromagnetic time reversal technique (EMTR) is studied in the electromagnetic compatibility (EMC) context. The main issue addressed by this approach is to deal with EM radiating sources identification. This paper is intended to provide a time domain (TD) study of EMTR in the near field (NF) and prove its efficiency in characterizing transient disturbances in power electronics. The reconstruction of EM emissions is based on two stages. First, modeling process relies on the use of TD analytical expressions. Second, signal processing is referring to time reversal (TR) technique, which defines an inverse problem resolution. The method proposes to identify a set of equivalent dipoles. The validation is carried out experimentally using a TD measurement bench. The main purposes of this method is to extract the dipoles locations, moments and orientation. The magnetic field maps calculated at each time step using obtained equivalent sources are compared to measured distributions. Adequate agreement is achieved, which confirms the efficiency of the proposed method. In addition, for validation purposes, the equivalent model is compared to that obtained by a frequency domain (FD) method based on the standard genetic algorithms. Unlike FD, TD investigations allow characterizing transient disturbances in power electronic systems that emit strong EM interferences, by finding a sufficient equivalent model valid on a wide frequency band at once.

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“…The TD techniques allow the radiation pattern measurement in non-anechoic environment as presented in [8]. These are well adapted for the parasitic electromagnetic radiation emitted from electronic devices for electromagnetic compatibility purpose [9]. Also, using TD techniques one can measure the radiation pattern of radar structures fed by non-sinusoidal excitation signals.…”

Section: Introductionmentioning

confidence: 99%

On the Near-Field Sampling and Truncation Errors in Planar Time-Domain Near-Field to Far-Field Transformation

Serhir¹

2015

PIER B

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Abstract-This paper studies the effect of three important parameters in planar time-domain (TD) near-field (NF) to far-field (FF) transformation. These parameters are the NF spatial sampling, NF measurement distance and scan surface truncation. The effect of these parameters over the TD FF accuracy are difficult to predict for Ultra Wide Band antennas. In this paper we aim to choose the optimum NF measurement parameters guaranteeing accurate calculation of the time-domain far-field. This allows the optimization of the computation time and memory requirements. Computations using analytic array of elementary dipoles radiation pattern are used to study the impact of each parameter in time-domain near-field antenna measurement. The comparison of the far-field results are presented in time and frequency domains. In particular, it is shown that the choice of the measurement distance and the size of the scan surface decide predominantly on the frequency band of accurate FF calculation. The used formalism in this paper for the NF to FF transformation is based on the Green's function.

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Fully Time-Domain Scanning of Em Near-Field Radiated by Rf Circuits

Cited by 25 publications

References 47 publications

SCNIFFER: Low-Cost, Automated, Efficient Electromagnetic Side-Channel Sniffing

SCNIFFER: Low-Cost, Automated, Efficient Electromagnetic Side-Channel Sniffing

Electromagnetic Time Reversal in the Near Field: Characterization of Transient Disturbances in Power Electronics

On the Near-Field Sampling and Truncation Errors in Planar Time-Domain Near-Field to Far-Field Transformation

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