2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) 2017
DOI: 10.1109/isvlsi.2017.61
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Functional Broadside Test Generation Using a Commercial ATPG Tool

Nai‐Xing Wang
1
,
Bo Yao
2
,
Xijiang Lin
3
et al.
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Cited by 3 publications
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Structured DFT Based Analysis of Standard Benchmark Circuits

Shravani
1
,
Anita
2
2019
Lecture Notes in Electrical Engineering
4
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Structured DFT Based Analysis of Standard Benchmark Circuits

Shravani
1
,
Anita
2
2019
Lecture Notes in Electrical Engineering
4
0
0
0
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Test Coverage Analysis of DFT with EDT and without EDT Architecture

Gopikrishna
1
,
Jindal
2
2021
2021 12th International Conference on Computing Communication and Networking Technologies (ICCCNT)
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Performance analysis of embedded deterministic test (EDT) on standard benchmark designs

Manasy
1
,
Devika
2
,
Murugan
3
2017
2017 International Conference on Technological Advancements in Power and Energy ( TAP Energy)
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