Abstract:The imaging of objects by standard bright field microscopy is limited by the wavelength of light. An advanced high resolution microscopy technique, based on a relatively simple principle, is atomic force microscopy (AFM). In this technique the topography of a surface is mapped by measuring the force acting on an extremely sharp tip when it is scanned over a surface of interest. Nanoscale resolution can be obtained with AFM, which makes it an indispensable tool for nanotechnology. Next to imaging, even more exc… Show more
Set email alert for when this publication receives citations?
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.