Fundamental Aspects of Ion Microanalysis

Blaise, G.

doi:10.1007/978-1-4684-0856-0_6

Cited by 17 publications

(3 citation statements)

References 98 publications

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“…Iron imaged at the m/z 56 generates a poor yield of emission which restricts its observation with SIMS (600 cps in our conditions) (Blaize 1978) (Fig. 1c).…”

Section: Resultsmentioning

confidence: 96%

The use of secondary ion mass spectrometry coupled with image analysis to identify and locate chemical elements in soil minerals: The example of phosphorus

Bertrand

Grignon

Hinsinger³

et al. 2001

Scanning

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Summary:The mobility and bioavailability of elements in soils and sediments largely depends on their distribution on the diverse inorganic and organic constituents. This work addresses the example of phosphorus (P) associated to goethite and calcite, that is, to the major minerals involved in the retention of P in soils and sediments in calcareous environments. Synthetic goethite (FeOOH) and calcite (CaCO 3 ) were reacted with P prior to being analysed by dynamic secondary ion mass spectrometry (SIMS). Powdery samples were embedded in resin, cut in thin sections, and imaged with a CAMECA IMS 4F ion microscope used in scanning mode with a primary ion beam of caesium that produced negatively charged secondary ions ( − ) (Cameca, Cedex, France). Carbon, O, P, and calcium (Ca) were directly imaged at m/z 12, 16, 31, and 40, respectively, while Fe was imaged via the polyatomic ion FeO − ion at m/z 72. The SIMS data were treated by image analysis procedures. The visual comparison of images and the scatterplot method showed that P strongly interacted with goethite, probably following an adsorption process, and was thus evenly distributed at its surface. Conversely, P was not evenly distributed at the surface of calcite which rather suggests a precipitation process, and the scatterplot method confirmed a poor relationship between P and Ca. For the goethite-calcite mixture, visual examination suggested that P occurred as clusters which were largely associated with calcite, whereas a statistical analysis of the various images showed that the distribution of P was largely related to that of goethite particles. This work confirms the potential contribution of iron oxides in the retention of P in calcareous environments and shows that coupling image analysis to sensitive analytical techniques such as SIMS is a powerful approach for providing quantitative information on the location of elements at low bulk concentrations.

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“…Iron imaged at the m/z 56 generates a poor yield of emission which restricts its observation with SIMS (600 cps in our conditions) (Blaize 1978) (Fig. 1c).…”

Section: Resultsmentioning

confidence: 96%

The use of secondary ion mass spectrometry coupled with image analysis to identify and locate chemical elements in soil minerals: The example of phosphorus

Bertrand

Grignon

Hinsinger³

et al. 2001

Scanning

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“…In alkaline metals, the fraction of sputtered particles in the ionic state can be large [22,23]. Measurement of the dose in these experiments is done from the current collected on the lithium sample.…”

Section: Data Analysis and Calculationsmentioning

confidence: 99%

“…These results are presented in Section 5. The difference between secondary ion fraction and secondary ion sputtering yield has been studied extensively [23].…”

Section: Data Analysis and Calculationsmentioning

confidence: 99%

Measurements and modelling of solid phase lithium sputtering

Allain

Ruzic

2002

Nucl. Fusion

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The absolute sputtering yields of D + , He + and Li + on deuterium saturated solid lithium have been measured and modelled at 45 • incidence in the energy range 100-1000 eV. The Ion-surface InterAction Experiment (IIAX) was used to measure the absolute sputtering yield of lithium in the solid phase from bombardment with a Colutron ion source. The lithium sample was treated with a deuterium plasma from a hollow cathode source. Measurements also include bombardment of non-deuterium-saturated lithium surfaces. The results lead to the conclusion that the chemical state of the deuterium treated lithium surface plays a major role in the decrease of the lithium sputtering yield. Specifically, preferential sputtering of implanted deuterium atoms over lithium atoms in deuterium treated samples results in a decrease of at least 60% of the lithium sputtering yield, in the case of He + bombardment. These results also demonstrate that lithium self-sputtering is well below unity and that the fraction of sputtered species in an ionic state ranges from 55 to 65% for incident particle energies between 100 and 1000 eV. Furthermore, correlation of Monte Carlo VFTRIM-3D simulations and IIAX experimental data demonstrate that the surface composition has a one to one ratio between deuterium and lithium components.

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