Fundamental parameter model for quantification of total reflection X-ray fluorescence analysis

Determination of Sr to Ca ratio in solid carbonate, fluoride, and nitrate samples using the fundamental parameters of EDXRF: experimental and empirical evaluation of non-destructive assays in light matrices

“…Therefore, for the secondary uorescence of Ca in the sample, I 0,Sr can be replaced numerically by the product of I 0 , E 0 and C Sr . The ratio of attenuation of the characteristic X-rays of Sr to that of Ca during their travel from the sample to detector in the sample chamber is designated as the attenuation factor, f atten,Sr,Ca , which is given by eqn (9).…”

“…These practical difficulties include: (i) lack of prior knowledge about the composition, (ii) either unavailability or high cost of the precursors, and (iii) difficulties in reproducing the conditions for their formation (for example, slow geological formations, which take several years or decades). [7][8][9][10] Compensation/matrix correction methods, incorporating compensation procedures have been proven to be very valuable in many applications. Theoretical modeling can be a plausible approach for samples that are difficult to replicate in laboratories.…”

“…The versatility of mathematical models to depict the dependence of uorescence intensity on the sample composition is constantly being evaluated by the analytical chemistry fraternity. 8,9,[11][12][13] The drawbacks of many of the earlier reported models were revealed during their application in inhomogeneous samples with non-uniform surfaces. 5,9 Thus, there is a need to achieve coherence between theoretical and experimental evaluations to fully utilize the potential of both.…”

“…8,9,[11][12][13] The drawbacks of many of the earlier reported models were revealed during their application in inhomogeneous samples with non-uniform surfaces. 5,9 Thus, there is a need to achieve coherence between theoretical and experimental evaluations to fully utilize the potential of both.…”

2020 atomic spectrometry update – a review of advances in X-ray fluorescence spectrometry and its special applications

“…A detailed description of this procedure was presented and this will enable other researchers to apply this approach in their studies. An FP approach was also used 58 to quantify contamination on the surface of high purity silicon wafers. Although this procedure did not require the application of an external calibration or the addition of an IS, additional angle-scan measurements were necessary to solve the theoretical equations.…”