2014
DOI: 10.1080/00107514.2014.962096
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Fundamentals of Picoscience, edited by Klaus D. Sattler

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“…It is known that the optical interferometric methods allow the measurement of sub-nanometer dynamic displacements [15,16]. These techniques have been applied to a variety of determinations [17,18] and are particularly interesting in the case of electromechanical properties of piezoelectric materials.…”
Section: Introductionmentioning
confidence: 99%
“…It is known that the optical interferometric methods allow the measurement of sub-nanometer dynamic displacements [15,16]. These techniques have been applied to a variety of determinations [17,18] and are particularly interesting in the case of electromechanical properties of piezoelectric materials.…”
Section: Introductionmentioning
confidence: 99%
“…As we can see in (3), to effectively retrieve ∆φ v−h (t), the current to voltage conversion needs to be linear. The photodiode response is linear when we sample the photocurrent under the conditions V BIAS ≥ 0 and V BIAS > V OU T = I T R (Fig.…”
Section: A Characteristics Of the Current To Voltage Convertermentioning
confidence: 99%
“…It is known that optical interferometric methods allow the measurement of sub-nanometer dynamic displacements [2], [3]. These techniques have been applied to a variety of determinations [4], [5] and are particularly interesting in the case of electromechanical properties of materials [6], single nanoparticle detection in fluids [7] or observation of gravitational waves [8].…”
Section: Introduction: Detection Of Optical Interferometric Signalsmentioning
confidence: 99%