2008
DOI: 10.1007/978-0-387-47314-7
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Fundamentals of Power Semiconductor Devices

Abstract: except for brief excerpts in connection with reviews or scholarly analysis. Use in connection with any form of information storage and retrieval, electronic adaptation, computer software, or by similar or dissimilar methodology now known or hereafter developed is forbidden. The use in this publication of trade names, trademarks, service marks and similar terms, even if they are not identified as such, is not to be taken as an expression of opinion as to whether or not they are subject to proprietary rights.

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Cited by 1,680 publications
(633 citation statements)
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References 11 publications
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“…4H-SiC 9.7 [90] 980 [90] 3.1 [213] 370 [90] In general, for UWBG materials to have impact on these applications, vertical device structures [90,214,215] similar to those utilized today for Si and SiC will need to be developed. While lateral UWBG devices such as HEMTs or MESFETs may be quite useful for high-frequency switching applications (and preliminary devices of this type have been realized in the AlGaN [157] and (AlGa) 2 O 3 [216] systems), lateral devices will likely be less useful for very high-voltage (defined somewhat arbitrarily as >5 kV) applications.…”
Section: Methodsmentioning
confidence: 99%
“…4H-SiC 9.7 [90] 980 [90] 3.1 [213] 370 [90] In general, for UWBG materials to have impact on these applications, vertical device structures [90,214,215] similar to those utilized today for Si and SiC will need to be developed. While lateral UWBG devices such as HEMTs or MESFETs may be quite useful for high-frequency switching applications (and preliminary devices of this type have been realized in the AlGaN [157] and (AlGa) 2 O 3 [216] systems), lateral devices will likely be less useful for very high-voltage (defined somewhat arbitrarily as >5 kV) applications.…”
Section: Methodsmentioning
confidence: 99%
“…1. The device can be seen as a voltage-controlled current source and an equivalent resistance r, together with parasitic capacitances, inductances and resistances [20]. The IGBT switching process can be divided into the steady state and the transient.…”
Section: Electrical Characteristics Of Igbt and Influencing Factorsmentioning
confidence: 99%
“…Because trench-gate structure can reduce on-state voltage drop comparing with a planar-gate IGBT under the same blocking voltage capability, especially for devices with high switching speed [19].…”
Section: ) Igbt Chip Modelmentioning
confidence: 99%