Abstract-A basic challenge in the IGBT transient simulation study is to obtain realistic junction temperature, which demands not only accurate electrical simulation but also precise thermal impedance. This paper proposed a novel thermal impedance model considering of local temperature effects through Finite Element Method (FEM) simulation. The proposed method is applied to a case study of 1700 V/1000 A IGBT module. Furthermore, a testing setup the studied IGBT open module and an ultra-fast infrared (IR) camera has been constructed to validate the proposed model.