2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) 2012
DOI: 10.1109/iemt.2012.6521781
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Further characterization of 2<sup>nd</sup> bond in bare Cu wire and Pd coated Cu wire on various leadframe plating scheme

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“…In the case of ta hinner AuAg layer, it is expected that less Cu atoms diffused into the slip plane, causing a weaker stitch bonding. [8,9]. However this was not observed across the bonding surface during the studies.…”
Section: Resultsmentioning
confidence: 88%
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“…In the case of ta hinner AuAg layer, it is expected that less Cu atoms diffused into the slip plane, causing a weaker stitch bonding. [8,9]. However this was not observed across the bonding surface during the studies.…”
Section: Resultsmentioning
confidence: 88%
“…However, distinct layers of palladium (Pd) and AuAg were not visible due to the FESEM image resolution limit. Studies by Tan et al and Loh et al show the layer thinning of Au and sinking on the preplated leadframe surface with Cu wires with different bonding parameters[8,9]. However this was not observed across the bonding surface during the studies.…”
mentioning
confidence: 88%