2010 IEEE International Ultrasonics Symposium 2010
DOI: 10.1109/ultsym.2010.5935950
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Future integration of silicon electronics with miniature piezoelectric ultrasonic transducers and arrays

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Cited by 6 publications
(3 citation statements)
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“…1). The current generation of scanners include 1½ and 2-dimensional arrays allowing improved in-and out-of-plane (elevational) focusing, rapid image processing, and 3-D and 4-D imaging (real-time volumetric imaging) (47)(48)(49)(50)(51)(52) (Fig. 7, Fig.…”
Section: Fig 1 a Compact Ultrasound System With Wireless Chargeable T...mentioning
confidence: 99%
“…1). The current generation of scanners include 1½ and 2-dimensional arrays allowing improved in-and out-of-plane (elevational) focusing, rapid image processing, and 3-D and 4-D imaging (real-time volumetric imaging) (47)(48)(49)(50)(51)(52) (Fig. 7, Fig.…”
Section: Fig 1 a Compact Ultrasound System With Wireless Chargeable T...mentioning
confidence: 99%
“…It is also possible to integrate piezoelectric materials in thick [53] or thin film [54,55] form, or indeed bonded bulk material [56], with other components. Requiring an additional level of fabrication sophistication, typically including photolithography [57], this approach may be very useful when the number of devices is high and may be a key issue in differentiating acoustic manipulation from optical manipulation [58], where integration is still much harder.…”
Section: Limitations and Typical Parameters For On-chip Manipulationmentioning
confidence: 99%
“…An inverse filtering approach more fully measures all mechanisms of image degradation, including aberration by the near skull, path-dependent aberration, and path-dependent attenuation, although when applied to skull aberrations, it uses a phase screen assumption in approximating the propagation operator as a diagonal matrix [40]. However, the cost of implementing this approach on a 2-D array is significant, requiring a fully programmable transmitter and access to the RF signal for each element, a difficult proposition at a time when many manufacturers have moved toward digitization and partial beamforming in the probe handle [76], [77]. In this work, it is assumed that aberration effects from the first skull transit are small relative to aberration effects resulting from the second skull transit, because wave divergence and path-dependent effects tend to average out any initial aberrations, whereas aberration effects caused by the second skull transit are directly measured immediately after they occur.…”
Section: Introductionmentioning
confidence: 99%